公开(公告)号：US11085825B2

公开(公告)日：2021-08-10

申请号：US16368771

申请日：2019-03-28

Applicant: Si-Ware Systems

Inventor： Mostafa Medhat ,  Bassem Mortada ,  Yasser Sabry ,  Mohamed Hossam ,  Momen Anwar ,  Ahmed Shebl ,  Hisham Haddara ,  Bassam A. Saadany

IPC: G01J3/45 ,  G01J3/02 ,  G01J3/10 ,  G01J3/42 ,  G01J3/453 ,  G01J3/26

Abstract: Aspects of the disclosure relate to a self-referenced spectrometer for providing simultaneous measurement of a background or reference spectral density and a sample or other spectral density. The self-referenced spectrometer includes an interferometer optically coupled to receive an input beam and to direct the input beam along a first optical path to produce a first interfering beam and a second optical path to produce a second interfering beam, where each interfering beam is produced prior to an output of the interferometer. The spectrometer further includes a detector optically coupled to simultaneously detect a first interference signal produced from the first interfering beam and a second interference signal produced from the second interfering beam, and a processor configured to process the first interference signal and the second interference signal and to utilize the second interference signal as a reference signal in processing the first interference signal.

公开(公告)号：US20190301939A1

公开(公告)日：2019-10-03

申请号：US16368771

申请日：2019-03-28

Applicant: Si-Ware Systems

Inventor： Mostafa Medhat ,  Bassem Mortada ,  Yasser Sabry ,  Mohamed Hossam ,  Momen Anwar ,  Ahmed Shebl ,  Hisham Haddara ,  Bassam A. Saadany

IPC: G01J3/45 ,  G01J3/10 ,  G01J3/02 ,  G01J3/42

Abstract: Aspects of the disclosure relate to a self-referenced spectrometer for providing simultaneous measurement of a background or reference spectral density and a sample or other spectral density. The self-referenced spectrometer includes an interferometer optically coupled to receive an input beam and to direct the input beam along a first optical path to produce a first interfering beam and a second optical path to produce a second interfering beam, where each interfering beam is produced prior to an output of the interferometer. The spectrometer further includes a detector optically coupled to simultaneously detect a first interference signal produced from the first interfering beam and a second interference signal produced from the second interfering beam, and a processor configured to process the first interference signal and the second interference signal and to utilize the second interference signal as a reference signal in processing the first interference signal.