公开(公告)号：US20250006245A1

公开(公告)日：2025-01-02

申请号：US18343007

申请日：2023-06-28

Applicant: Silicon Laboratories Inc.

Inventor： Gang Yuan ,  Bertrand Jeffery Williams

IPC: G11C11/4074 ,  G11C11/406 ,  G11C11/4099

Abstract: In one embodiment, an apparatus includes: a replica sampler circuit to sample a first voltage that is based on a reference voltage, the replica sampler circuit to at least approximate a non-linearity of a bias generator. The replica sampler circuit may include: a switch circuit, when enabled, to pass the first voltage; and a capacitor coupled to the switch circuit, the capacitor to be charged by the first voltage. The apparatus also may include a comparator coupled to the replica sampler circuit, the comparator having a first input terminal to receive the sampled first voltage and a second input terminal to receive the reference voltage, where the comparator is to output a first signal having a first value when the sampled first voltage departs from the reference voltage by at least a threshold amount, to cause a refresh of at least a portion of the bias generator.