公开(公告)号：US11193972B2

公开(公告)日：2021-12-07

申请号：US16734692

申请日：2020-01-06

Applicant: Siliconware Precision Industries Co., Ltd.

Inventor： Bo-Siang Fang ,  Kuan-Ta Chen ,  Hsinjou Lin

IPC: G01R31/28

Abstract: An inspection equipment is used for inspecting an antenna, and includes a testing device having a first circuit structure, a carrier, a supporting part and a second circuit structure detachably stacked on one another sequentially. Therefore, the carrier, the first circuit structure, the second circuit structure or the supporting part can be detached when different devices under test are inspected, without replacing the whole testing device, thereby achieving effects of modular replacing and cost saving.

公开(公告)号：US20210123962A1

公开(公告)日：2021-04-29

申请号：US16723233

申请日：2019-12-20

Applicant: Siliconware Precision Industries Co., Ltd.

Inventor： Bo-Siang Fang ,  Kuang-Sheng Wang ,  Hsinjou Lin ,  Shao-Meng Sim ,  Mao-Hua Yeh

IPC: G01R29/10 ,  H04B17/29

Abstract: Testing equipment is used in an antenna testing process, and includes a testing head having a perforation, and a testing device having a cylinder. The cylinder is disposed in the perforation to act as a cavity for the antenna testing process. Therefore, only the cylinder needs to be replaced when the antenna testing process is performed on different devices under test, with the whole testing head intact.

公开(公告)号：US11747382B2

公开(公告)日：2023-09-05

申请号：US16723233

申请日：2019-12-20

Applicant: Siliconware Precision Industries Co., Ltd.

Inventor： Bo-Siang Fang ,  Kuang-Sheng Wang ,  Hsinjou Lin ,  Shao-Meng Sim ,  Mao-Hua Yeh

IPC: G01R29/10 ,  H04B17/29

CPC classification number: G01R29/105 ,  H04B17/29

Abstract: Testing equipment is used in an antenna testing process, and includes a testing head having a perforation, and a testing device having a cylinder. The cylinder is disposed in the perforation to act as a cavity for the antenna testing process. Therefore, only the cylinder needs to be replaced when the antenna testing process is performed on different devices under test, with the whole testing head intact.

公开(公告)号：US20210072307A1

公开(公告)日：2021-03-11

申请号：US16734692

申请日：2020-01-06

Applicant: Siliconware Precision Industries Co., Ltd.

Inventor： Bo-Siang Fang ,  Kuan-Ta Chen ,  Hsinjou Lin

IPC: G01R31/28

Abstract: An inspection equipment is used for inspecting an antenna, and includes a testing device having a first circuit structure, a carrier, a supporting part and a second circuit structure detachably stacked on one another sequentially. Therefore, the carrier, the first circuit structure, the second circuit structure or the supporting part can be detached when different devices under test are inspected, without replacing the whole testing device, thereby achieving effects of modular replacing and cost saving.