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公开(公告)号:US20200052393A1
公开(公告)日:2020-02-13
申请号:US16232840
申请日:2018-12-26
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Bo-Siang Fang , Kuan-Ta Chen , Chia-Chu Lai
Abstract: An electronic package is provided with a first substrate having a first antenna portion that is stacked on a second substrate having a second antenna portion via an antenna component. During a packaging process, a gap between the first substrate and the second substrate is held constantly by the antenna component. At the same time, the antenna component is regarded as a third antenna portion of the electronic package. The performance of the antennae is not adversely affected by the antenna component despite the fact that the antenna component is in close proximity to the first and second antenna portions.
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公开(公告)号:US11747382B2
公开(公告)日:2023-09-05
申请号:US16723233
申请日:2019-12-20
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Bo-Siang Fang , Kuang-Sheng Wang , Hsinjou Lin , Shao-Meng Sim , Mao-Hua Yeh
CPC classification number: G01R29/105 , H04B17/29
Abstract: Testing equipment is used in an antenna testing process, and includes a testing head having a perforation, and a testing device having a cylinder. The cylinder is disposed in the perforation to act as a cavity for the antenna testing process. Therefore, only the cylinder needs to be replaced when the antenna testing process is performed on different devices under test, with the whole testing head intact.
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公开(公告)号:US20210013583A1
公开(公告)日:2021-01-14
申请号:US16554952
申请日:2019-08-29
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Ying-Wei Lu , Bo-Siang Fang , Kuan-Ta Chen , Chia-Chu Lai
IPC: H01Q1/22
Abstract: An electronic package is provided. A functioning member having a concave portion and a second antenna portion is disposed on a carrier having a first antenna portion. The concave portion and the carrier form a functioning space. The first antenna portion and the second antenna portion are disposed in a projection space of the functioning space. The first antenna portion induces the second antenna portion.
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公开(公告)号:US11193972B2
公开(公告)日:2021-12-07
申请号:US16734692
申请日:2020-01-06
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Bo-Siang Fang , Kuan-Ta Chen , Hsinjou Lin
IPC: G01R31/28
Abstract: An inspection equipment is used for inspecting an antenna, and includes a testing device having a first circuit structure, a carrier, a supporting part and a second circuit structure detachably stacked on one another sequentially. Therefore, the carrier, the first circuit structure, the second circuit structure or the supporting part can be detached when different devices under test are inspected, without replacing the whole testing device, thereby achieving effects of modular replacing and cost saving.
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公开(公告)号:US20200304165A1
公开(公告)日:2020-09-24
申请号:US16843386
申请日:2020-04-08
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Bo-Siang Fang , Kuan-Ta Chen , Ying-Wei Lu , Chia-Chu Lai , Cheng-Tsai Hsieh
IPC: H04B1/48 , H04B1/7085 , G01S13/40 , H04B1/04 , G01S13/32
Abstract: A testing system includes: a bilinear polarized antenna for receiving and dividing a circularly polarized radio wave associating with a horizontal and a vertical polarization path of an object-to-be-tested into a first and a second high frequency signal; a phase retarder for delaying a phase of the first high frequency signal by 90 degrees to form a first high frequency signal with a phase delay of 90 degrees; a power splitter for receiving or synthesizing the first high frequency signal with the phase delay of 90 degrees and the second high frequency signal; and a high frequency signal transceiver for measuring power of the first high frequency signal with the phase delay of 90 degrees and the second high frequency signal and determining states of the horizontal and vertical polarization paths of the object-to-be-tested based on the power. Therefore, the testing system can speed up testing of the object-to-be-tested.
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公开(公告)号:US20190319347A1
公开(公告)日:2019-10-17
申请号:US16044154
申请日:2018-07-24
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Bo-Siang Fang , Kuan-Ta Chen , Chia-Chu Lai , Ying-Wei Lu
IPC: H01Q1/38 , H01Q1/40 , H01L23/552 , H01L23/31 , H01L23/66
Abstract: An electronic package includes: a carrier structure; a first electronic component disposed on the carrier structure; a first insulating layer formed on the carrier structure; a first antenna structure coupled to the first insulating layer and electrically connected to the first electronic component; and a second antenna structure embedded in the carrier structure. As such, the electronic package provides more antenna functions within a limited space so as to improve the signal quality and transmission rate of electronic products. An electronic device having the electronic package is also provided. The electronic device is applicable to an electronic product having an antenna function.
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公开(公告)号:US11081776B2
公开(公告)日:2021-08-03
申请号:US16554952
申请日:2019-08-29
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Ying-Wei Lu , Bo-Siang Fang , Kuan-Ta Chen , Chia-Chu Lai
IPC: H01Q1/22
Abstract: An electronic package is provided. A functioning member having a concave portion and a second antenna portion is disposed on a carrier having a first antenna portion. The concave portion and the carrier form a functioning space. The first antenna portion and the second antenna portion are disposed in a projection space of the functioning space. The first antenna portion induces the second antenna portion.
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公开(公告)号:US20210072307A1
公开(公告)日:2021-03-11
申请号:US16734692
申请日:2020-01-06
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Bo-Siang Fang , Kuan-Ta Chen , Hsinjou Lin
IPC: G01R31/28
Abstract: An inspection equipment is used for inspecting an antenna, and includes a testing device having a first circuit structure, a carrier, a supporting part and a second circuit structure detachably stacked on one another sequentially. Therefore, the carrier, the first circuit structure, the second circuit structure or the supporting part can be detached when different devices under test are inspected, without replacing the whole testing device, thereby achieving effects of modular replacing and cost saving.
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公开(公告)号:US10903547B2
公开(公告)日:2021-01-26
申请号:US16192262
申请日:2018-11-15
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Ying-Wei Lu , Bo-Siang Fang , Kuan-Ta Chen
Abstract: An electronic package includes an antenna structure and an adjustment structure arranged on a carrier structure. The antenna structure includes an antenna body and a feed line that are disposed on different layers and a conductive pillar that interconnects the layers to electrically connect the antenna body and the feed line. The adjustment structure extends from the feed line to improve the bandwidth of the antenna body.
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公开(公告)号:US20200072886A1
公开(公告)日:2020-03-05
申请号:US16408389
申请日:2019-05-09
Applicant: Siliconware Precision Industries Co., Ltd.
Inventor: Bo-Siang Fang , Cheng-Tsai Hsieh , Kuan-Ta Chen , Ying-Wei Lu
Abstract: A testing fixture used in an antenna testing process is provided. A cover unit having a second antenna portion is arranged on a base unit configured for an electronic structure having a first antenna portion to be placed thereon. The cover unit includes a non-metal interposing portion configured for pressing the electronic structure to separate the second antenna portion from the first antenna portion. Therefore, when the antenna testing process is performed on the electronic structure, a metal shielding effect is avoided, and an over the air testing environment is provided.
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