Error calibration apparatus and method

    公开(公告)号:US11876527B2

    公开(公告)日:2024-01-16

    申请号:US17548575

    申请日:2021-12-12

    摘要: An error calibration apparatus and method are provided. The method is adapted for calibrating a machine learning (ML) accelerator. The ML accelerator achieves computation by using an analog circuit. An error between an output value of one or more computing layers of a neural network and a corresponding corrected value is determined. The computation of the computing layers is achieved by the analog circuit. A calibration node is generated according to the error. The calibration node is located at the next layer of the computing layers. The calibration node is used to minimize the error. The calibration node is achieved by a digital circuit. Accordingly, error and distortion of the analog circuit could be reduced.

    ERROR CALIBRATION APPARATUS AND METHOD

    公开(公告)号:US20230097158A1

    公开(公告)日:2023-03-30

    申请号:US17548575

    申请日:2021-12-12

    摘要: An error calibration apparatus and method are provided. The method is adapted for calibrating a machine learning (ML) accelerator. The ML accelerator achieves computation by using an analog circuit. An error between an output value of one or more computing layers of a neural network and a corresponding corrected value is determined. The computation of the computing layers is achieved by the analog circuit. A calibration node is generated according to the error. The calibration node is located at the next layer of the computing layers. The calibration node is used to minimize the error. The calibration node is achieved by a digital circuit. Accordingly, error and distortion of the analog circuit could be reduced.