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1.发明申请SIMULTANEOUS INORGANIC MASS SPECTROMETER AND METHOD OF INORGANIC MASS SPECTROMETRY 有权无机无机质谱仪和无机质谱法同时测定公开(公告)号：US20140312219A1
公开(公告)日：2014-10-23
申请号：US14323275
申请日：2014-07-03
发明人： Dirk ARDELT , Ulrich HEYNEN , Adi A. Scheidemann
IPC分类号： H01J49/32
CPC分类号： H01J49/025 , B01D59/44 , H01J49/322
摘要： An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, ion optics to separate ions out of a plasma beam, a Mattauch-Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before an entrance slit, and a solid state multi-channel detector substantially separated from ground potential and separated from the potential of the magnet.
摘要翻译： 能够同时测量相关的和大的或全质谱范围的无机质谱仪可以包括合适的离子源（例如，具有ICP离子源的ICP质谱仪），离子转移区域，离子光学器件，用于将离子从 等离子体束，具有一组带电粒子束光学器件的Mattauch-Herzog型质谱仪，用于在入射狭缝之前调节离子束，以及基本上与地电位分离并与磁体的电位分离的固态多通道检测器 。
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2.发明授权公开(公告)号：US09330892B2
公开(公告)日：2016-05-03
申请号：US14323275
申请日：2014-07-03
发明人： Dirk Ardelt , Ulrich Heynen , Adi A. Scheidemann
CPC分类号： H01J49/025 , B01D59/44 , H01J49/322
摘要： An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, ion optics to separate ions out of a plasma beam, a Mattauch-Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before an entrance slit, and a solid state multi-channel detector substantially separated from ground potential and separated from the potential of the magnet.
摘要翻译： 能够同时测量相关的和大的或全质谱范围的无机质谱仪可以包括合适的离子源（例如，具有ICP离子源的ICP质谱仪），离子转移区域，离子光学器件，用于将离子从 等离子体束，具有一组带电粒子束光学器件的Mattauch-Herzog型质谱仪，用于在入射狭缝之前调节离子束，以及基本上与地电位分离并与磁体的电位分离的固态多通道检测器 。
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