OPTOMECHANICALLY COMPENSATED SPECTROMETER

    公开(公告)号:US20170322077A1

    公开(公告)日:2017-11-09

    申请号:US15262061

    申请日:2016-09-12

    摘要: A spectrometer for examining the spectrum of an optical emission source may include: an optical base body, a light entry aperture connected to the optical base body to couple light into the spectrometer, at least one dispersion element to receive the light as a beam of rays and generate a spectrum, and at least one detector for measuring the generated spectrum. A light path may run from the light entry aperture to the detector. A mirror group with at least two mirrors may be provided in a section of the light path between the light entry aperture and the at least one detector, in which the beam does not run parallel, which may compensate for temperature effects. In the mirror group, at least one mirror or the entire mirror group may be moveable relative to the optical base body and may be coupled to a temperature-controlled drive.

    SIMULTANEOUS INORGANIC MASS SPECTROMETER AND METHOD OF INORGANIC MASS SPECTROMETRY
    2.
    发明申请
    SIMULTANEOUS INORGANIC MASS SPECTROMETER AND METHOD OF INORGANIC MASS SPECTROMETRY 有权
    无机无机质谱仪和无机质谱法同时测定

    公开(公告)号:US20140312219A1

    公开(公告)日:2014-10-23

    申请号:US14323275

    申请日:2014-07-03

    IPC分类号: H01J49/32

    摘要: An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, ion optics to separate ions out of a plasma beam, a Mattauch-Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before an entrance slit, and a solid state multi-channel detector substantially separated from ground potential and separated from the potential of the magnet.

    摘要翻译: 能够同时测量相关的和大的或全质谱范围的无机质谱仪可以包括合适的离子源(例如,具有ICP离子源的ICP质谱仪),离子转移区域,离子光学器件,用于将离子从 等离子体束,具有一组带电粒子束光学器件的Mattauch-Herzog型质谱仪,用于在入射狭缝之前调节离子束,以及基本上与地电位分离并与磁体的电位分离的固态多通道检测器 。

    ARRANGEMENT FOR OPTICAL EMISSION SPECTROMETRY WITH IMPROVED LIGHT YIELD

    公开(公告)号:US20200158649A1

    公开(公告)日:2020-05-21

    申请号:US16688034

    申请日:2019-11-19

    IPC分类号: G01N21/73

    摘要: An arrangement for optical emission spectrometry with a spectrochemical source, which during operation emits non-directed radiation, and with a spectrometer having at least one entry aperture arranged at a side next to the source, at least one dispersive element and at least one detector, which are arranged such that during operation part of the radiation emitted in the direction of the entry aperture from the source enters the spectrometer through the entry aperture, from the entry aperture falls indirectly or directly on the dispersive element(s), is split up according to wavelengths and is registered by the at least one detector. A mirror may be arranged at a side of the source opposed to the entry aperture at a distance from the source to reflect at least one part of the radiation, not emitted in the direction of the entry aperture from the source, in the direction of the entry aperture.

    METHOD FOR COMPENSATING A SPECTRUM DRIFT IN A SPECTROMETER

    公开(公告)号:US20180128679A1

    公开(公告)日:2018-05-10

    申请号:US15807925

    申请日:2017-11-09

    IPC分类号: G01J3/02 G01J3/28 G01J3/443

    摘要: A method for compensating spectrum drift in a spectrometer having a radiation source, optical apparatus to split up a spectrum into spectral lines according to wavelengths of radiation from the radiation source, a number of detectors to receive partial spectra, and which are provided with respective pluralities of pixels to measure radiation intensity, and a catalogue of spectral lines of different chemical elements that may be used as correction lines. The method may include generating and recording an emission spectrum of a sample; determining pixels receiving the maximum of the peaks for respective partial spectra and identifying respective peak positions for the peak maxima; for the respective peak positions, determining if there is a correction line within a predetermined maximum distance from the peak position, and if so, calculating a distance between the peak position and the correction line; and calculating a correction function for assignment of peak positions.

    Simultaneous inorganic mass spectrometer and method of inorganic mass spectrometry
    6.
    发明授权
    Simultaneous inorganic mass spectrometer and method of inorganic mass spectrometry 有权
    无机质谱仪同时测定和无机质谱法

    公开(公告)号:US09330892B2

    公开(公告)日:2016-05-03

    申请号:US14323275

    申请日:2014-07-03

    IPC分类号: H01J49/02 H01J49/32 B01D59/44

    摘要: An inorganic mass spectrometer capable of measuring a relevant and large or the full mass spectral range simultaneously may include a suitable ion source (e.g., an ICP mass spectrometer with an ICP ion source), an ion transfer region, ion optics to separate ions out of a plasma beam, a Mattauch-Herzog type mass spectrometer with a set of charged particle beam optics to condition the ion beam before an entrance slit, and a solid state multi-channel detector substantially separated from ground potential and separated from the potential of the magnet.

    摘要翻译: 能够同时测量相关的和大的或全质谱范围的无机质谱仪可以包括合适的离子源(例如,具有ICP离子源的ICP质谱仪),离子转移区域,离子光学器件,用于将离子从 等离子体束,具有一组带电粒子束光学器件的Mattauch-Herzog型质谱仪,用于在入射狭缝之前调节离子束,以及基本上与地电位分离并与磁体的电位分离的固态多通道检测器 。

    Method and apparatus for calibrating spectrometers

    公开(公告)号:US11092490B2

    公开(公告)日:2021-08-17

    申请号:US16707395

    申请日:2019-12-09

    IPC分类号: G01J3/28 G01J3/02

    摘要: The invention relates to a method and a spectrometer for wavelength-dependent measurement of radiation in the range of UV light and visible light, with an entry gap, a dispersive element and a number of sensors comprising pixels, wherein a light path runs inside the spectrometer from the entry slot to the sensors and an imaging element is provided, which focusses the radiation on the sensors, in the case of which a means for defocussing the radiation is provided, which is activatable for the purpose of calibration.

    OPTICAL EMISSION SPECTROSCOPE WITH A PIVOTABLY MOUNTED INDUCTIVELY COUPLED PLASMA SOURCE

    公开(公告)号:US20170343478A1

    公开(公告)日:2017-11-30

    申请号:US15535977

    申请日:2014-12-15

    摘要: An optical emission spectrometry instrument may comprise an inductively coupled plasma generator (ICP) with an electromagnetic coil having input and ground connectors. The electromagnetic coil may be mounted to a mounting disk, and the input connector may be coupled to a power output of a radio frequency power source, and the ground connector may be connected to the mounting disk. A spectro-chemical source may be used for sample excitation. The spectro-chemical source and the ICP may have a longitudinal axis. An optical system may be included for viewing the spectro-chemical source with a fixed view axis. The electromagnetic coil may be mounted pivotably around one of its connectors so that the orientation of the ICP can be altered from a first orientation of its longitudinal axis to a second orientation of its longitudinal axis, and vice versa.

    Optical emission spectroscope with a pivotably mounted inductively coupled plasma source

    公开(公告)号:US10107759B2

    公开(公告)日:2018-10-23

    申请号:US15535977

    申请日:2014-12-15

    摘要: An optical emission spectrometry instrument may comprise an inductively coupled plasma generator (ICP) with an electromagnetic coil having input and ground connectors. The electromagnetic coil may be mounted to a mounting disk, and the input connector may be coupled to a power output of a radio frequency power source, and the ground connector may be connected to the mounting disk. A spectro-chemical source may be used for sample excitation. The spectro-chemical source and the ICP may have a longitudinal axis. An optical system may be included for viewing the spectro-chemical source with a fixed view axis. The electromagnetic coil may be mounted pivotably around one of its connectors so that the orientation of the ICP can be altered from a first orientation of its longitudinal axis to a second orientation of its longitudinal axis, and vice versa.