System and method for imprint lithography to facilitate dual damascene integration in a single imprint act
    1.
    发明授权
    System and method for imprint lithography to facilitate dual damascene integration in a single imprint act 有权
    用于压印光刻的系统和方法,以便于在单一印记法中双重镶嵌一体化

    公开(公告)号:US07709373B1

    公开(公告)日:2010-05-04

    申请号:US11553220

    申请日:2006-10-26

    IPC分类号: H01L21/4763

    摘要: A system and method are provided to facilitate dual damascene interconnect integration in a single imprint step. The method provides for creation of a translucent imprint mold with three-dimensional features comprising the dual damascene pattern to be imprinted. The imprint mold is brought into contact with a photopolymerizable organosilicon imaging layer deposited upon a transfer layer which is spin coated or otherwise deposited upon a dielectric layer of a substrate. When the photopolymerizable layer is exposed to a source of illumination, it cures with a structure matching the dual damascene pattern of the imprint mold. A halogen breakthrough etch followed by oxygen transfer etch transfer the vias from the imaging layer into the transfer layer. A second halogen breakthrough etch followed by a second oxygen transfer etch transfer the trenches from the imaging layer into the transfer layer. A dielectric etch transfers the pattern from the transfer layer into the dielectric layer. A metal fill process then fills the dual damascene openings of the dielectric layer with metal.

    摘要翻译: 提供了一种系统和方法,以便在单个压印步骤中促进双镶嵌互连集成。 该方法提供了具有三维特征的半透明压印模具的创建,该三维特征包括要印刷的双镶嵌图案。 压印模具与沉积在转移层上的可光聚合的有机硅成像层接触,转移层被旋涂或以其它方式沉积在基底的电介质层上。 当可光聚合层暴露于照明源时,它可以用匹配印模的双镶嵌图案的结构固化。 卤素穿透蚀刻随后氧传递蚀刻将通孔从成像层转移到转移层中。 第二个卤素穿透蚀刻,随后是第二次氧转移蚀刻,将沟槽从成像层转移到转移层中。 电介质蚀刻将图案从转印层转移到电介质层中。 然后,金属填充过程用金属填充介电层的双镶嵌开口。

    Using supercritical fluids to clean lenses and monitor defects
    2.
    发明授权
    Using supercritical fluids to clean lenses and monitor defects 有权
    使用超临界流体清洁镜头并监测缺陷

    公开(公告)号:US07381278B1

    公开(公告)日:2008-06-03

    申请号:US11555564

    申请日:2006-11-01

    IPC分类号: G03B27/42

    摘要: Disclosed are immersion lithography methods involving irradiating a first photoresist through a lens and an immersion liquid, the immersion liquid contacting the lens and the first photoresist in a first apparatus; contacting the lens with a supercritical fluid in a second apparatus; and irradiating a second photoresist through the lens and an immersion liquid, the immersion liquid contacting the lens and the second photoresist in the first apparatus.

    摘要翻译: 公开了浸没式光刻方法,包括通过透镜和浸没液体照射第一光致抗蚀剂,浸没液体在第一装置中与透镜和第一光致抗蚀剂接触; 在第二装置中使透镜与超临界流体接触; 以及通过所述透镜和浸没液体照射第二光致抗蚀剂,所述浸没液体与所述透镜和所述第二光致抗蚀剂接触。