Method and apparatus for adaptively learning test measurement delays on an individual device test for reducing total device test time
    1.
    发明授权
    Method and apparatus for adaptively learning test measurement delays on an individual device test for reducing total device test time 失效
    用于在单个设备测试中自适应地测试测试测量延迟的方法和装置,用于减少总设备测试时间

    公开(公告)号:US06377901B1

    公开(公告)日:2002-04-23

    申请号:US09259866

    申请日:1999-03-01

    CPC classification number: G01R31/3016 G01R31/31937

    Abstract: An adaptive delay learning algorithm is presented that reduces the amount of delay before making test measurements in an automated test that requires a delay of any type to be completed before a measurement is made in order to remove the possibility that a tester component lying in the measurement path has not achieved a ready state. In the execution of an automated test, a current delay time is set to an initial delay value. Test execution does not begin until the current delay time elapses. If, upon execution, the test fails, the current delay time is set to a different delay time, and the test is reexecuted only after the updated current delay time has elapsed.

    Abstract translation: 提出了一种自适应延迟学习算法,在进行测量之前,需要在任何类型的延迟进行测量之前,进行测试测量之前减少延迟量,以消除测量仪器在测量中的可能性 路径尚未实现准备状态。 在执行自动测试时,将当前延迟时间设置为初始延迟值。 直到目前的延迟时间过去,测试执行才会开始。 如果执行测试失败,则当前延迟时间设置为不同的延迟时间,并且只有在更新的当前延迟时间过后才能重新执行测试。

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