METHOD AND EVALUATION DEVICE FOR DETERMINING THE POSITION OF A STRUCTURE LOCATED IN AN OBJECT TO BE EXAMINED BY MEANS OF X-RAY COMPUTER TOMOGRAPHY
    1.
    发明申请
    METHOD AND EVALUATION DEVICE FOR DETERMINING THE POSITION OF A STRUCTURE LOCATED IN AN OBJECT TO BE EXAMINED BY MEANS OF X-RAY COMPUTER TOMOGRAPHY 有权
    用于确定位于通过X射线计算机平面图进行检查的对象中的结构的位置的方法和评估装置

    公开(公告)号:US20130223722A1

    公开(公告)日:2013-08-29

    申请号:US13882817

    申请日:2011-10-31

    IPC分类号: G06T7/00

    摘要: In a method and an evaluation device for determining the position of a structure located in an object to be investigated by means of X-ray computer tomography, a cutting data record, which images the object in a cutting plane, is determined from a volume data record of the object. The cutting data record is binarized to form a binary data record, in which the structure voxels imaging the structure and the surface voxels imaging an object surface are determined. To determine the position, a distance data record is produced in such a way that a distance value, which characterizes the smallest distance of the respective distance voxel from the surface voxels, is assigned to each distance voxel of the distance data record. The distance voxels corresponding to the structure voxels are then determined and the associated distance values evaluated.

    摘要翻译: 在通过X射线计算机断层摄影确定位于待研究对象中的结构的位置的方法和评估装置中,根据卷数据确定在切割平面中对物体进行成像的切割数据记录 对象的记录。 切割数据记录被二值化以形成二进制数据记录,其中结构体素对结构进行成像和对物体表面成像的表面体素进行确定。 为了确定位置,产生距离数据记录,使得将距离体素与表面体素的最小距离表征的距离值分配给距离数据记录的每个距离体素。 然后确定与结构体素相对应的距离体素,并评估相关联的距离值。

    Method and evaluation device for determining the position of a structure located in an object to be examined by means of X-ray computer tomography
    2.
    发明授权
    Method and evaluation device for determining the position of a structure located in an object to be examined by means of X-ray computer tomography 有权
    用于通过X射线计算机断层摄影来确定位于待检查物体中的结构的位置的方法和评估装置

    公开(公告)号:US08897534B2

    公开(公告)日:2014-11-25

    申请号:US13882817

    申请日:2011-10-31

    IPC分类号: G06K9/00 G06T7/00

    摘要: In a method and an evaluation device for determining the position of a structure located in an object to be investigated by means of X-ray computer tomography, a cutting data record, which images the object in a cutting plane, is determined from a volume data record of the object. The cutting data record is binarized to form a binary data record, in which the structure voxels imaging the structure and the surface voxels imaging an object surface are determined. To determine the position, a distance data record is produced in such a way that a distance value, which characterizes the smallest distance of the respective distance voxel from the surface voxels, is assigned to each distance voxel of the distance data record. The distance voxels corresponding to the structure voxels are then determined and the associated distance values evaluated.

    摘要翻译: 在通过X射线计算机断层摄影确定位于待研究对象中的结构的位置的方法和评估装置中,根据卷数据确定在切割平面中对物体进行成像的切割数据记录 对象的记录。 切割数据记录被二值化以形成二进制数据记录,其中结构体素对结构进行成像和对物体表面成像的表面体素进行确定。 为了确定位置,产生距离数据记录,使得将距离体素与表面体素的最小距离表征的距离值分配给距离数据记录的每个距离体素。 然后确定与结构体素相对应的距离体素,并评估相关联的距离值。

    DEVICE AND METHOD FOR PRODUCING A CT RECONSTRUCTION OF AN OBJECT COMPRISING A HIGH-RESOLUTION OBJECT REGION OF INTEREST
    3.
    发明申请
    DEVICE AND METHOD FOR PRODUCING A CT RECONSTRUCTION OF AN OBJECT COMPRISING A HIGH-RESOLUTION OBJECT REGION OF INTEREST 审中-公开
    用于生产包含高分辨率对象区域的对象的CT重建的装置和方法

    公开(公告)号:US20100266181A1

    公开(公告)日:2010-10-21

    申请号:US12741071

    申请日:2009-04-30

    IPC分类号: G06K9/00 A61B6/03

    摘要: A CT reconstruction of an object including a high-resolution object region of interest may be produced in an artefact-free manner by producing a first projection data set of a first region of the object that encloses the object region of interest and includes at least one projection recording of a first resolution, and a second projection data set of the object region of interest including at least a second projection recording of a second, higher resolution. The first and second projection data sets may be combined, in accordance with a combination rule, so as to obtain a CT reconstruction of the first region of the object having the first resolution and of the object region of interest having the second, higher resolution.

    摘要翻译: 包括感兴趣的高分辨率对象区域的对象的CT重构可以通过产生包围感兴趣对象区域的对象的第一区域的第一投影数据集,并且包括至少一个 第一分辨率的投影记录以及所述感兴趣对象区域的第二投影数据组包括至少第二高分辨率的第二投影记录。 可以根据组合规则组合第一和第二投影数据集,以获得具有第一分辨率的对象的第一区域和具有第二较高分辨率的感兴趣对象区域的CT重建。

    Device and method for evaluating a characteristic of an object
    4.
    发明申请
    Device and method for evaluating a characteristic of an object 审中-公开
    用于评估对象特征的装置和方法

    公开(公告)号:US20050154563A1

    公开(公告)日:2005-07-14

    申请号:US10488313

    申请日:2004-02-27

    IPC分类号: G06F17/00 G06T5/00 G06T7/00

    摘要: An apparatus for evaluating a state of an object includes a means for providing a three-dimensional representation of the object including information about the state to be evaluated. The three-dimensional representation is then subdivided into a plurality of sub-areas that are subsequently evaluated sub-area by sub-area, namely by two-dimensionally examining each sub-area of the plurality of sub-areas, in order to ascertain data about a place in a sub-area at which the state deviates from a default state. A three-dimensional connection analysis using the data about the places from the individual sub-areas provides a three-dimensional description of a three-dimensional place whose state deviates from the default state. By splitting up the three-dimensional representation into several sub-areas that may be analyzed two-dimensionally, powerful image processing algorithms may be employed. The three-dimensionality is then again achieved by means of a connection analysis of the two-dimensional data. Thus it may be done without a geometric reference model as well as the accompanying requirement for memory and computation time.

    摘要翻译: 用于评估对象的状态的装置包括用于提供对象的三维表示的装置,包括关于待评估状态的信息。 然后将三维表示细分为随后通过子区域评估的子区域,即通过二维地检查多个子区域中的每个子区域来确定数据的多个子区域 关于状态偏离默认状态的子区域中的位置。 使用关于来自各个子区域的位置的数据的三维连接分析提供其状态偏离默认状态的三维位置的三维描述。 通过将三维表示分解成可以二维分析的几个子区域,可以采用强大的图像处理算法。 然后通过二维数据的连接分析再次实现三维度。 因此,可以在没有几何参考模型的情况下完成,以及伴随的对存储器和计算时间的要求。