DISPLAY DEVICE AND FABRICATING METHOD THEREOF
    2.
    发明申请
    DISPLAY DEVICE AND FABRICATING METHOD THEREOF 有权
    显示装置及其制作方法

    公开(公告)号:US20070108899A1

    公开(公告)日:2007-05-17

    申请号:US11560153

    申请日:2006-11-15

    Abstract: A display device includes a thin film transistor formed on a first insulating substrate, a first electrode electrically connected with the thin film transistor, an emission layer formed on the first electrode, a second electrode formed on the emission layer, an auxiliary electrode shaped like a mesh to at least partially expose the first electrode, the auxiliary electrode being electrically connected with the second electrode and receiving a common voltage therefrom, and a second insulating substrate placed on the auxiliary electrode. The exemplary embodiments of a display device, and a method of manufacturing the same, according to the present invention can apply a common voltage efficiently throughout the display and have an improved contrast ratio.

    Abstract translation: 显示装置包括形成在第一绝缘基板上的薄膜晶体管,与薄膜晶体管电连接的第一电极,形成在第一电极上的发射层,形成在发射层上的第二电极,形状类似于 筛网以至少部分地暴露第一电极,辅助电极与第二电极电连接并从其接收公共电压,以及放置在辅助电极上的第二绝缘基板。 根据本发明的显示装置的示例性实施例及其制造方法可以在整个显示器上有效地施加公共电压并且具有改善的对比度。

    TEST HANDLER FOR TESTING SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE USING THE SAME
    3.
    发明申请
    TEST HANDLER FOR TESTING SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE USING THE SAME 审中-公开
    用于测试半导体器件的测试操作器和使用其测试半导体器件的方法

    公开(公告)号:US20080079456A1

    公开(公告)日:2008-04-03

    申请号:US11778160

    申请日:2007-07-16

    Applicant: Sung-soo LEE

    Inventor: Sung-soo LEE

    CPC classification number: G01R31/2893 G01R31/2862 G01R31/2865

    Abstract: Provided is a test handler for testing a semiconductor device mounted in a test tray with a test head disposed separately below the test tray under predetermined testing condition at high or low temperature. The test handler includes a thermal isolator to maintain constant the predetermined testing condition at high or low temperature when the test chamber and the test head are separated. The thermal isolator is a shutter that is installed below the test chamber to seal or open the test chamber.

    Abstract translation: 提供了一种用于测试安装在测试托盘中的半导体器件的测试处理器,其中测试头在高温或低温下的预定测试条件下分开设置在测试托盘下方。 测试处理器包括热隔离器,以在测试室和测试头分离时在高或低温下保持恒定的预定测试条件。 热隔离器是安装在测试室下面以将密封或打开测试室的快门。

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