Testing of non stuck-at faults in memory

    公开(公告)号:US08516315B2

    公开(公告)日:2013-08-20

    申请号:US12906517

    申请日:2010-10-18

    Applicant: Suraj Prakash

    Inventor: Suraj Prakash

    CPC classification number: G11C29/10 G11C17/00 G11C29/50 G11C2029/0401

    Abstract: A method for identifying non stuck-at faults in a read-only memory (ROM) includes generating a golden value of a victim cell, providing a fault-specific pattern through an aggressor cell, generating a test reading of the victim cell in response to the provided fault-specific pattern, and determining whether the ROM has at least one non stuck-at fault. The determination is based on a comparison of the golden value and the test reading of the victim cell.

    Diagnosis flow for read-only memories
    2.
    发明授权
    Diagnosis flow for read-only memories 有权
    只读存储器的诊断流程

    公开(公告)号:US09003251B2

    公开(公告)日:2015-04-07

    申请号:US12767948

    申请日:2010-04-27

    Applicant: Suraj Prakash

    Inventor: Suraj Prakash

    CPC classification number: G11C29/12 G11C17/00 G11C29/42

    Abstract: A system and a method for diagnosis flow for a read-only memory (ROM) includes determining whether a window of the ROM is faulty, based on a pre-computed signature and a computed signature corresponding to the window. Based on the determination, the size of the window is reduced to form at least two reduced windows. It is further ascertained whether the at least two reduced windows are faulty based on pre-computed signatures corresponding to the at least two reduced windows and computed signatures corresponding to the at least two reduced windows.

    Abstract translation: 用于只读存储器(ROM)的诊断流程的系统和方法包括基于预先计算的签名和对应于该窗口的计算签名来确定ROM的窗口是否有故障。 基于该确定,窗口的尺寸被减小以形成至少两个缩小的窗口。 还基于与所述至少两个减少的窗口对应的预先计算的签名和对应于所述至少两个缩小的窗口的计算的签名来进一步确定所述至少两个缩减的窗口是否有故障。

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