Tool health information monitoring and tool performance analysis in semiconductor processing
    1.
    发明授权
    Tool health information monitoring and tool performance analysis in semiconductor processing 失效
    半导体加工中的工具健康信息监测和刀具性能分析

    公开(公告)号:US07630858B1

    公开(公告)日:2009-12-08

    申请号:US11904858

    申请日:2007-09-28

    IPC分类号: G06F17/18 G06F19/00

    摘要: A plurality of tool identifiers, a plurality of information types, and a plurality of report types are displayed in a first user interface of a tool health reporting system. A user selection of a distinct report type from the plurality of report types, a distinct information type from the plurality of information types, and a distinct tool identifier from the plurality of tool identifiers are received. A report is displayed in a second user interface of the tool health reporting system, the report including data associated with the distinct information type, the distinct report type and the distinct tool identifier, wherein the report correlates equipment based measurement data to product level measurement data.

    摘要翻译: 在工具健康报告系统的第一用户界面中显示多个工具标识符,多个信息类型和多个报告类型。 接收来自多个报告类型的不同报告类型的用户选择,来自多个信息类型的不同信息类型以及来自多个工具标识符的不同工具标识符。 报告显示在工具健康报告系统的第二用户界面中,报告包括与不同信息类型相关联的数据,不同报告类型和不同的工具标识符,其中该报告将基于设备的测量数据与产品级测量数据相关联 。