公开(公告)号：US20240061035A1

公开(公告)日：2024-02-22

申请号：US18071080

申请日：2022-11-29

申请人： Synopsys, Inc.

发明人： Mayukh BHATTACHARYA ,  Jonti TALUKDAR ,  Shan YUAN ,  Huiping HUANG

IPC分类号： G01R31/28 ,  G06F30/323 ,  G06F30/3308

CPC分类号： G01R31/2848 ,  G06F30/323 ,  G06F30/3308

摘要： A method of determining defect sensitization includes parsing a netlist of a circuit design to determine a plurality of potential defects and partitioning the circuit design into a plurality of blocks. The method also includes generating a graph representing the circuit design and determining a transitive closure of the graph. The method further includes grouping the plurality of potential defects to produce a plurality of groups of potential defects and selecting a potential defect from each group of the plurality of groups to form a simulation group of potential defects. The method also includes simulating the circuit design by injecting, into the circuit design, every potential defect of the simulation group to produce a set of outputs of the plurality of blocks and determining a defect sensitization for the simulation group of potential defects based on the set of outputs of the plurality of blocks.