Method and system for diagnosing anomaly in a manufacturing plant

    公开(公告)号:US11625032B2

    公开(公告)日:2023-04-11

    申请号:US17753834

    申请日:2020-09-26

    Abstract: Industrial plants involve a large amount of equipment, which generate a large amount of data. By analyzing this data, the operator can diagnose anomaly in the plant. Analyzing this data is difficult and time taking task. A method and system for diagnosing anomaly in an industrial system in a time efficient and convenient manner has been provided. The system is configured to diagnose the anomaly by finding out one or more sensors responsible for the anomaly. The present disclosure treats the anomaly detection model as a score generating function. Whenever for a particular instance the score given by the anomaly detection model crosses a pre-determined threshold, anomaly is reported and the diagnosis algorithm is triggered. The system is configured to diagnose the anomaly predicted in case of time series as well as non-time series data.

    Method and system for industrial anomaly detection

    公开(公告)号:US11934183B2

    公开(公告)日:2024-03-19

    申请号:US17596568

    申请日:2020-06-12

    CPC classification number: G05B23/024 G05B19/4183 G05B19/4184

    Abstract: The disclosure relates to anomaly detection in an industrial environment including multiple industrial units and systems, generating huge volume of data. The conventional methods rely only on sensor data alone. The techniques of handling missing data plays a crucial role in determining the performance of industrial anomaly detection system. Further, imputation of missing data could cause error in computation, thus affecting the accuracy of the industrial anomaly detection system. The present disclosure addresses the problems associated with missing data by utilizing a masking technique. Further, the present disclosure utilizes quantitative and qualitative metadata associated with industrial system along with the sensor data to improve anomaly detection performance. Furthermore, the present disclosure includes a model recommendation system which provides transfer learning based utilization of existing models for similar industrial systems.

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