公开(公告)号：US20250110171A1

公开(公告)日：2025-04-03

申请号：US18677217

申请日：2024-05-29

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Abhinay PATIL ,  Vinayak HEGDE ,  Umang AGARWAL

IPC: G01R31/28 ,  G01R35/00

Abstract: One example includes a circuit. The circuit includes a transistor device arranged between a first terminal and a second terminal and a transistor device controller configured to control operation of the transistor device. The circuit further includes a current limit controller that includes a current limit circuit configured to regulate an amplitude of operational current through the transistor device between the first and second terminals during a normal operating mode, and a testing system configured to conduct a calibration current provided by an automated testing equipment (ATE) device through an internal test resistor for the ATE device to determine a resistance value of the internal test resistor during a test mode to facilitate testing of the current limit circuit via a test current provided by the ATE device between the first and second terminals through the transistor device based on the determined resistance value of the internal test resistor.