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公开(公告)号:US09747507B2
公开(公告)日:2017-08-29
申请号:US14567481
申请日:2014-12-11
Applicant: Texas Instruments Incorporated
Inventor: Prashanth R. Viswanath , Suriya Narayanan L
CPC classification number: G06K9/00798 , G06K9/00791 , G06T7/536 , G06T7/579 , G06T2207/30256
Abstract: A ground plane detection system including an imaging device operable to generate at least two images of a scene and an image processing assembly operable to receive the at least two images of the scene and to generate a model of each image and to perform homography computations through use of corresponding features in the models of each image.
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公开(公告)号:US20160117569A1
公开(公告)日:2016-04-28
申请号:US14794916
申请日:2015-07-09
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: KUMAR DESAPPAN , Prashanth R. Viswanath , Pramod Kumar Swami
CPC classification number: G06K9/4671 , G06K9/00973 , G06T7/73 , G06T9/20 , G06T2207/10004 , G06T2207/20164
Abstract: Systems and methods are provided for selecting feature points within an image. A plurality of candidate feature points are identified in the image. A plurality of feature points are selected for each of the plurality of candidate feature points, a plurality of sets of representative pixels. For each set of representative pixels, a representative value is determined as one of a maximum chromaticity value and a minimum chromaticity value from the set of representative pixels. A score is determined for each candidate feature point from the representative values for the plurality of sets of representative pixels associated with the candidate feature point. The feature points are selected according to the determined scores for the plurality of candidate feature points.
Abstract translation: 提供了用于选择图像内的特征点的系统和方法。 在图像中识别多个候选特征点。 为多个候选特征点中的每一个,多个代表像素组选择多个特征点。 对于每组代表像素,代表值被确定为来自代表像素集合的最大色度值和最小色度值之一。 根据与候选特征点相关联的多组代表性像素的代表值,确定每个候选特征点的得分。 根据多个候选特征点的确定得分来选择特征点。
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公开(公告)号:US09747515B2
公开(公告)日:2017-08-29
申请号:US14794916
申请日:2015-07-09
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Kumar Desappan , Prashanth R. Viswanath , Pramod Kumar Swami
CPC classification number: G06K9/4671 , G06K9/00973 , G06T7/73 , G06T9/20 , G06T2207/10004 , G06T2207/20164
Abstract: Systems and methods are provided for selecting feature points within an image. A plurality of candidate feature points are identified in the image. A plurality of feature points are selected for each of the plurality of candidate feature points, a plurality of sets of representative pixels. For each set of representative pixels, a representative value is determined as one of a maximum chromaticity value and a minimum chromaticity value from the set of representative pixels. A score is determined for each candidate feature point from the representative values for the plurality of sets of representative pixels associated with the candidate feature point. The feature points are selected according to the determined scores for the plurality of candidate feature points.
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公开(公告)号:US20150178573A1
公开(公告)日:2015-06-25
申请号:US14567481
申请日:2014-12-11
Applicant: Texas Instruments Incorporated
Inventor: Prashanth R. Viswanath , Suriya Narayanan L
CPC classification number: G06K9/00798 , G06K9/00791 , G06T7/536 , G06T7/579 , G06T2207/30256
Abstract: A ground plane detection system including an imaging device operable to generate at least two images of a scene and an image processing assembly operable to receive the at least two images of the scene and to generate a model of each image and to perform homography computations through use of corresponding features in the models of each image.
Abstract translation: 一种接地平面检测系统,包括可操作以产生场景的至少两个图像的成像装置和可操作以接收场景的至少两个图像的图像处理组件,并且生成每个图像的模型并且通过使用执行单应计算 在每个图像的模型中的相应特征。
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公开(公告)号:US10102445B2
公开(公告)日:2018-10-16
申请号:US15688458
申请日:2017-08-28
Applicant: Texas Instruments Incorporated
Inventor: Kumar Desappan , Prashanth R. Viswanath , Pramod Kumar Swami
Abstract: Systems and methods are provided for selecting feature points within an image. A plurality of candidate feature points are identified in the image. A plurality of feature points are selected for each of the plurality of candidate feature points, a plurality of sets of representative pixels. For each set of representative pixels, a representative value is determined as one of a maximum chromaticity value and a minimum chromaticity value from the set of representative pixels. A score is determined for each candidate feature point from the representative values for the plurality of sets of representative pixels associated with the candidate feature point. The feature points are selected according to the determined scores for the plurality of candidate feature points.
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公开(公告)号:US20170357874A1
公开(公告)日:2017-12-14
申请号:US15688458
申请日:2017-08-28
Applicant: Texas Instruments Incorporated
Inventor: Kumar Desappan , Prashanth R. Viswanath , Pramod Kumar Swami
CPC classification number: G06K9/4671 , G06K9/00973 , G06T7/73 , G06T9/20 , G06T2207/10004 , G06T2207/20164
Abstract: Systems and methods are provided for selecting feature points within an image. A plurality of candidate feature points are identified in the image. A plurality of feature points are selected for each of the plurality of candidate feature points, a plurality of sets of representative pixels. For each set of representative pixels, a representative value is determined as one of a maximum chromaticity value and a minimum chromaticity value from the set of representative pixels. A score is determined for each candidate feature point from the representative values for the plurality of sets of representative pixels associated with the candidate feature point. The feature points are selected according to the determined scores for the plurality of candidate feature points.
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7.
公开(公告)号:US20170076173A1
公开(公告)日:2017-03-16
申请号:US15345523
申请日:2016-11-08
Applicant: TEXAS INSTRUMENTS INCORPORATED
CPC classification number: G06K9/4638 , G06K9/00986 , G06K9/4604 , G06K9/481 , G06K9/6211
Abstract: This invention enables effective corner detection of pixels of an image using the FAST algorithm using a vector SIMD processor. This invention loads an 8×8 pixel block that includes four 7×7 pixel blocks including the 16 peripheral pixels to be tested for each of four center pixels. This invention rearranges the 64 pixels of the 8×8 block to form a 16 element array for each center pixel preferably using a vector permutation instruction. This invention uses vector SIMD subtraction and compare and vector SIMD addition and compare to make the FAST algorithm comparisons. The N consecutive pixels determinations of the FAST algorithm are made from the results of plural shift and AND operations. The corresponding center pixel is marked a corner or not a corner dependent upon of the results of plural shift and AND operations.
Abstract translation: 本发明可以使用使用向量SIMD处理器的FAST算法来有效地角度检测图像的像素。 本发明加载包括四个7×7像素块的8×8像素块,包括要测试的四个中心像素中的每一个的16个外围像素。 本发明重新排列8×8块的64个像素,优选地使用向量置换指令来为每个中心像素形成16个元件阵列。 本发明使用矢量SIMD减法和比较和矢量SIMD加法比较,使得FAST算法比较。 FAST算法的N个连续像素确定由多个移位和“与”运算的结果进行。 取决于多个换档和“与”运算的结果,相应的中心像素被标记为拐角或不标记角。
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8.
公开(公告)号:US20160125257A1
公开(公告)日:2016-05-05
申请号:US14581401
申请日:2014-12-23
Applicant: Texas Instruments Incorporated
CPC classification number: G06K9/4638 , G06K9/00986 , G06K9/4604 , G06K9/481 , G06K9/6211
Abstract: This invention enables effective corner detection of pixels of an image using the FAST algorithm using a vector SIMD processor. This invention loads an 8×8 pixel block that includes four 7×7 pixel blocks including the 16 peripheral pixels to be tested for each of four center pixels. This invention rearranges the 64 pixels of the 8×8 block to form a 16 element array for each center pixel preferably using a vector permutation instruction. This invention uses vector SIMD subtraction and compare and vector SIMD addition and compare to make the FAST algorithm comparisons. The N consecutive pixels determinations of the FAST algorithm are made from the results of plural shift and AND operations. The corresponding center pixel is marked a corner or not a corner dependent upon of the results of plural shift and AND operations.
Abstract translation: 本发明可以使用使用向量SIMD处理器的FAST算法来有效地角度检测图像的像素。 本发明加载包括四个7×7像素块的8×8像素块,包括要测试的四个中心像素中的每一个的16个外围像素。 本发明重新排列8×8块的64个像素,优选地使用向量置换指令来为每个中心像素形成16个元件阵列。 本发明使用矢量SIMD减法和比较和矢量SIMD加法比较,使得FAST算法比较。 FAST算法的N个连续像素确定由多个移位和“与”运算的结果进行。 取决于多个换档和“与”运算的结果,相应的中心像素被标记为拐角或不标记角。
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