Abstract:
A system for quantifying x-ray backscatter system performance may include a support; a plurality of rods mounted on the support; the rods of the plurality of rods arranged parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width; and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, apply a transfer function to generate a transfer curve representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.
Abstract:
A system for quantifying x-ray backscatter system performance is disclosed. The system includes one or more x-ray backscatter detectors, an x-ray tube, a support, and a plurality of rods mounted on the support and arranged in groups. Each group of rods includes at least two rods having the same width. The system also includes a user interface configured to connect to the x-ray backscatter detectors to receive a backscatter signal from the x-ray backscatter detectors associated with the x-ray tube, where the user interface plots a modulation transfer function representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.
Abstract:
The present disclosure is generally directed to of method linear feature detection in a structure by providing a first digital image of the structure, creating a second corresponding digital image of the structure from the first digital image and determining a direction to shift pixels of the second corresponding digital image. A pixel shift value may be input to shift pixels of the second corresponding digital image, and pixels of the second corresponding digital image are shifted by the input pixel shift value in the determined direction. A third corresponding digital image of the structure may be calculated by subtracting the second corresponding digital image of the structure from the first digital image of the structure.
Abstract:
A system for quantifying x-ray backscatter system performance may include a support; a plurality of rods mounted on the support; the rods of the plurality of rods arranged parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width; and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, apply a transfer function to generate a transfer curve representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.
Abstract:
Embodiments of the present disclosure provide systems and methods for detecting one or more thermal and/or mechanical properties of a structure. The method may include forming one or more test structures from a material that forms the structure, generating and storing calibration data determined from the one or more test structures, emitting X-ray radiation into the structure, detecting X-ray scatter from the structure, and determining the one or more properties of the structure based on the detected X-ray scatter and the calibration data.
Abstract:
Inspection systems employing radiation filters with different attenuation characteristics to determine specimen irregularities, and related methods are disclosed. An inspection system includes a radiation emitter configured to emit a radiation beam along a radiation trajectory. Some of the radiation may be reflected by the specimen as backscatter and received by at least one radiation detector of the inspection system along the radiation trajectory. Irregularities and various materials of the specimen may produce backscatter radiation at different energies and/or scatter angles which may be identified by employing radiation filters having different attenuation characteristics. By employing these filters in communication with the radiation emitter and the radiation detector, the backscatter radiation passed through the filters may be measured and integrated at different positions of the radiation beam to produce a composite image of the specimen. In this manner, irregularities and associated materials within the specimen may be more easily identified.
Abstract:
A system for quantifying x-ray backscatter system performance may include a support, a plurality of rods mounted on the support, the rods of the plurality of rods arranged in parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width, and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, and generate a display representing photon counts of x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.
Abstract:
The present disclosure is generally directed to of method linear feature detection in a structure by providing a first digital image of the structure, creating a second corresponding digital image of the structure from the first digital image and determining a direction to shift pixels of the second corresponding digital image. A pixel shift value may be input to shift pixels of the second corresponding digital image, and pixels of the second corresponding digital image are shifted by the input pixel shift value in the determined direction. A third corresponding digital image of the structure may be calculated by subtracting the second corresponding digital image of the structure from the first digital image of the structure.
Abstract:
Embodiments of the present disclosure provide systems and methods for detecting one or more thermal and/or mechanical properties of a structure. The method may include forming one or more test structures from a material that forms the structure, generating and storing calibration data determined from the one or more test structures, emitting X-ray radiation into the structure, detecting X-ray scatter from the structure, and determining the one or more properties of the structure based on the detected X-ray scatter and the calibration data.
Abstract:
A system for quantifying x-ray backscatter system performance may include a support, a plurality of rods mounted on the support, the rods of the plurality of rods arranged in parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width, and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, and generate a display representing photon counts of x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.