Method For Improving Linear Feature Detectability In Digital Images
    3.
    发明申请
    Method For Improving Linear Feature Detectability In Digital Images 有权
    改进数字图像线性特征检测的方法

    公开(公告)号:US20150302572A1

    公开(公告)日:2015-10-22

    申请号:US14258432

    申请日:2014-04-22

    Abstract: The present disclosure is generally directed to of method linear feature detection in a structure by providing a first digital image of the structure, creating a second corresponding digital image of the structure from the first digital image and determining a direction to shift pixels of the second corresponding digital image. A pixel shift value may be input to shift pixels of the second corresponding digital image, and pixels of the second corresponding digital image are shifted by the input pixel shift value in the determined direction. A third corresponding digital image of the structure may be calculated by subtracting the second corresponding digital image of the structure from the first digital image of the structure.

    Abstract translation: 本公开一般涉及通过提供结构的第一数字图像在结构中的方法线性特征检测,从第一数字图像创建结构的第二对应数字图像,并且确定将第二对应的像素移位的方向 数字图像。 可以输入像素偏移值以移动第二对应数字图像的像素,并且将第二对应数字图像的像素沿所确定的方向移位输入像素移位值。 可以通过从结构的第一数字图像中减去第二对应的结构数字图像来计算结构的第三对应的数字图像。

    X-ray scatter systems and methods for detecting structural variations

    公开(公告)号:US10317349B2

    公开(公告)日:2019-06-11

    申请号:US14953689

    申请日:2015-11-30

    Abstract: Embodiments of the present disclosure provide systems and methods for detecting one or more thermal and/or mechanical properties of a structure. The method may include forming one or more test structures from a material that forms the structure, generating and storing calibration data determined from the one or more test structures, emitting X-ray radiation into the structure, detecting X-ray scatter from the structure, and determining the one or more properties of the structure based on the detected X-ray scatter and the calibration data.

    Backscatter inspection systems, and related methods

    公开(公告)号:US09851312B2

    公开(公告)日:2017-12-26

    申请号:US14272177

    申请日:2014-05-07

    CPC classification number: G01N23/203 G01N2223/313 G21K1/10

    Abstract: Inspection systems employing radiation filters with different attenuation characteristics to determine specimen irregularities, and related methods are disclosed. An inspection system includes a radiation emitter configured to emit a radiation beam along a radiation trajectory. Some of the radiation may be reflected by the specimen as backscatter and received by at least one radiation detector of the inspection system along the radiation trajectory. Irregularities and various materials of the specimen may produce backscatter radiation at different energies and/or scatter angles which may be identified by employing radiation filters having different attenuation characteristics. By employing these filters in communication with the radiation emitter and the radiation detector, the backscatter radiation passed through the filters may be measured and integrated at different positions of the radiation beam to produce a composite image of the specimen. In this manner, irregularities and associated materials within the specimen may be more easily identified.

    System and method for quantifying X-ray backscatter system performance
    7.
    发明授权
    System and method for quantifying X-ray backscatter system performance 有权
    用于量化X射线反向散射系统性能的系统和方法

    公开(公告)号:US09398676B2

    公开(公告)日:2016-07-19

    申请号:US14269930

    申请日:2014-05-05

    Abstract: A system for quantifying x-ray backscatter system performance may include a support, a plurality of rods mounted on the support, the rods of the plurality of rods arranged in parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width, and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, and generate a display representing photon counts of x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.

    Abstract translation: 用于量化x射线反向散射系统性能的系统可以包括支撑件,安装在支撑件上的多个杆,多个杆彼此平行布置的杆,具有大致弯曲的外表面,并且被布置成 变化的宽度,每组具有相同宽度的杆中的至少两个的组,以及被配置为连接以从与X射线管相关联的x射线反向散射检测器接收反向散射信号的用户界面,并且生成 显示由X射线管透射的X射线的多个杆中的每个杆的x射线反向散射的光子计数的显示。

    Method for improving linear feature detectability in digital images
    8.
    发明授权
    Method for improving linear feature detectability in digital images 有权
    改进数字图像线性特征检测的方法

    公开(公告)号:US09305344B2

    公开(公告)日:2016-04-05

    申请号:US14258432

    申请日:2014-04-22

    Abstract: The present disclosure is generally directed to of method linear feature detection in a structure by providing a first digital image of the structure, creating a second corresponding digital image of the structure from the first digital image and determining a direction to shift pixels of the second corresponding digital image. A pixel shift value may be input to shift pixels of the second corresponding digital image, and pixels of the second corresponding digital image are shifted by the input pixel shift value in the determined direction. A third corresponding digital image of the structure may be calculated by subtracting the second corresponding digital image of the structure from the first digital image of the structure.

    Abstract translation: 本公开一般涉及通过提供结构的第一数字图像在结构中的方法线性特征检测,从第一数字图像创建结构的第二对应数字图像,并且确定将第二对应的像素移位的方向 数字图像。 可以输入像素偏移值以移动第二对应数字图像的像素,并且将第二对应数字图像的像素沿所确定的方向移位输入像素移位值。 可以通过从结构的第一数字图像中减去第二对应的结构数字图像来计算结构的第三对应的数字图像。

    X-RAY SCATTER SYSTEMS AND METHODS FOR DETECTING STRUCTURAL VARIATIONS

    公开(公告)号:US20170153188A1

    公开(公告)日:2017-06-01

    申请号:US14953689

    申请日:2015-11-30

    CPC classification number: G01N23/203 G01N2223/053 G01N2223/303

    Abstract: Embodiments of the present disclosure provide systems and methods for detecting one or more thermal and/or mechanical properties of a structure. The method may include forming one or more test structures from a material that forms the structure, generating and storing calibration data determined from the one or more test structures, emitting X-ray radiation into the structure, detecting X-ray scatter from the structure, and determining the one or more properties of the structure based on the detected X-ray scatter and the calibration data.

    System and Method for Quantifying X-Ray Backscatter System Performance
    10.
    发明申请
    System and Method for Quantifying X-Ray Backscatter System Performance 有权
    用于量化X射线后向散射系统性能的系统和方法

    公开(公告)号:US20150319832A1

    公开(公告)日:2015-11-05

    申请号:US14269930

    申请日:2014-05-05

    Abstract: A system for quantifying x-ray backscatter system performance may include a support, a plurality of rods mounted on the support, the rods of the plurality of rods arranged in parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width, and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, and generate a display representing photon counts of x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.

    Abstract translation: 用于量化x射线反向散射系统性能的系统可以包括支撑件,安装在支撑件上的多个杆,多个杆彼此平行布置的杆,具有大致弯曲的外表面,并且被布置成 变化的宽度,每组具有相同宽度的杆中的至少两个的组,以及被配置为连接以从与X射线管相关联的x射线反向散射检测器接收反向散射信号的用户界面,并且生成 显示由X射线管透射的X射线的多个杆中的每个杆的x射线反向散射的光子计数的显示。

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