公开(公告)号：US11954848B2

公开(公告)日：2024-04-09

申请号：US17603658

申请日：2020-04-24

Applicant: TIAMA

Inventor： Olivier Colle ,  Benoit Cance ,  Laurent Cosneau ,  Laurent Desbat ,  Emanuel Maitre ,  Nicolas Szafran

IPC: G06T7/64 ,  G01B15/00 ,  G06T7/00 ,  G06T17/00 ,  H04N23/56 ,  H04N23/90

CPC classification number: G06T7/001 ,  G01B15/00 ,  G06T7/64 ,  G06T17/00 ,  H04N23/56 ,  H04N23/90 ,  G06T2200/08 ,  G06T2207/10028 ,  G06T2207/10116 ,  G06T2207/30108 ,  G06T2207/30241 ,  G06T2210/56

Abstract: The invention relates to a method and an installation for automatically measuring linear dimensions of manufactured objects (2) of a series comprising:



the disposition of at least one focal point (Fj) of X-rays, on a same base straight line parallel to the rectilinear trajectory of displacement of the objects and of one or several image sensors (Ci);
the acquisition, for each object during its displacement, of a set of one-dimensional images comprising, for a number (NK) of distinct section planes (Pk) containing the base straight line, a number (NP) of said images obtained along at least three different directions of projection (Dijk) in the section plane;
for each object, and for each distinct section plane (Pk), the determination, from the images obtained, of a delineation of the object in the considered section plane (Pk).