公开(公告)号：US20200153195A1

公开(公告)日：2020-05-14

申请号：US16680404

申请日：2019-11-11

Applicant: TRILUMINA CORP.

Inventor： Kevin M. Kupcho

IPC: H01S5/00 ,  H01S5/042 ,  G01R31/28

Abstract: Systems, methods, and devices are described for in-situ testing of vertical-cavity surface-emitting lasers (VCSELs), VCSEL arrays or laser diodes (each a laser). Testing may comprise bias voltage measurements of one or more lasers. Embodiments may comprise one of a laser, a driver circuit providing a bipolar drive to the laser, and a sensing circuit to measure and/or monitor damage or degradation of the laser. The bipolar drive may comprise a pulsed forward bias output configured to produce a light output during an on-time of the laser, and a pulsed reverse bias output during an off-time of the pulsed forward bias output. The pulsed outputs may comprise a variable, chirped frequency. One or more of a reverse leakage current, and a junction temperature may be measured to monitor a state of health of the laser.