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公开(公告)号：US10451808B2
公开(公告)日：2019-10-22
申请号：US15747247
申请日：2016-07-22
申请人： TRUSTEES OF BOSTON UNIVERSITY , David J. Bishop , Thomas Little , Jessica Morrison , Matthias Imboden
摘要： The invention provides a device comprising a movable micromirror adapted to receive light from one or more light source(s) and manipulate the reflected light. The micromirror can be actuated electrothermally. In particular, the micromirror is adapted to do at least one of: (a) tipping along a first axis; (b) tilting along a second axis; (c) changing focal length (i.e., varifocal mode); and (d) elevating (i.e., piston mode). The invention also provides a system comprising at least one device comprising a movable micromirror and at least one light source. The invention can be used in smart lighting applications.
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公开(公告)号：US20180231715A1
公开(公告)日：2018-08-16
申请号：US15747247
申请日：2016-07-22
申请人： David J. BISHOP , Thomas LITTLE , Jessica MORRISON , Matthias IBODEN , TRUSTEES OF BOSTON UNIVERSITY
CPC分类号： G02B6/3518 , G02B6/357 , G02B6/3584 , G02B26/02 , G02B26/06 , G02B26/0841 , G02B26/085
摘要： The invention provides a device comprising a movable micromirror adapted to receive light from one or more light source(s) and manipulate the reflected light. The micromirror can be actuated electrothermally. In particular, the micromirror is adapted to do at least one of: (a) tipping along a first axis; (b) tilting along a second axis; (c) changing focal length (i.e., varifocal mode); and (d) elevating (i.e., piston mode). The invention also provides a system comprising at least one device comprising a movable micromirror and at least one light source. The invention can be used in smart lighting applications.
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公开(公告)号：US11874343B2
公开(公告)日：2024-01-16
申请号：US18112229
申请日：2023-02-21
发明人： Joshua Javor , David Bishop , David Campbell , Matthias Imboden
IPC分类号： G01R33/022 , G01R33/038 , G01R33/00
CPC分类号： G01R33/022 , G01R33/0052 , G01R33/038 , G01R33/0385
摘要： A gradiometer includes a at least one magnet attached to a beam. The magnet moves in response to a magnetic force. A sensing element is configured to measure movement or deflection of the beam or magnet. The gradiometer is configured to determine a gradient of a magnetic field acting on the first magnet based on movement of the magnet. The gradiometer can further measure higher order gradients.
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公开(公告)号：US11614501B2
公开(公告)日：2023-03-28
申请号：US17692692
申请日：2022-03-11
发明人： Joshua Javor , David Bishop , David Campbell , Matthias Imboden
IPC分类号： G01R33/022 , G01R33/038 , G01R33/00
摘要： A gradiometer includes a at least one magnet attached to a beam. The magnet moves in response to a magnetic force. A sensing element is configured to measure movement or deflection of the beam or magnet. The gradiometer is configured to determine a gradient of a magnetic field acting on the first magnet based on movement of the magnet. The gradiometer can further measure higher order gradients.
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公开(公告)号：US11693065B2
公开(公告)日：2023-07-04
申请号：US17692651
申请日：2022-03-11
发明人： Joshua Javor , David Bishop , David Campbell , Matthias Imboden
IPC分类号： G01R33/022 , G01R33/038 , G01R33/00
CPC分类号： G01R33/022 , G01R33/0052 , G01R33/038 , G01R33/0385
摘要： A system and method of effectively measuring a change in a gradient of a magnetic field. The systems include a first magnet and a second magnet mechanically coupled together and aligned along a polarization axis. The first magnet and the second magnet are positioned such that a pair of like magnetic poles of the first magnet and the second magnet face in opposite directions. Further, the first magnet and the second magnet are configured to move along the polarization axis in response to a magnetic field. A sensing system is configured to measure a change in a gradient of the magnetic field based on the movement of the first magnet and second magnet along the polarization axis in response to the magnetic field.
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公开(公告)号：US20230204690A1
公开(公告)日：2023-06-29
申请号：US18112229
申请日：2023-02-21
发明人： Joshua Javor , David Bishop , David Campbell , Matthias Imboden
IPC分类号： G01R33/022 , G01R33/038 , G01R33/00
CPC分类号： G01R33/022 , G01R33/038 , G01R33/0052 , G01R33/0385
摘要： A gradiometer includes a at least one magnet attached to a beam. The magnet moves in response to a magnetic force. A sensing element is configured to measure movement or deflection of the beam or magnet. The gradiometer is configured to determine a gradient of a magnetic field acting on the first magnet based on movement of the magnet. The gradiometer can further measure higher order gradients.
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公开(公告)号：US20220291299A1
公开(公告)日：2022-09-15
申请号：US17692633
申请日：2022-03-11
IPC分类号： G01R33/022
摘要： A sensing system, and method of operating same, can act as a highly sensitive gradiometer. A first non-magnetic element, such as a sphere, is driven at a first resonance frequency along an axis. A magnet is attached to a second non-magnetic element, such as a plate, and driven at a second resonance frequency along the axis. The first non-magnetic element and the second non-magnetic element are coupled by a force along the axis, in resonance. The gradiometer is configured to determine a gradient magnetic field acting on one or more of the first non-magnetic element and magnet based on change in at least one resonance characteristic.
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公开(公告)号：US11933864B2
公开(公告)日：2024-03-19
申请号：US18199185
申请日：2023-05-18
发明人： Joshua Javor , David Bishop , David Campbell , Matthias Imboden
IPC分类号： G01R33/022 , G01R33/00 , G01R33/038
CPC分类号： G01R33/022 , G01R33/0052 , G01R33/038 , G01R33/0385
摘要： A system and method of effectively measuring a change in a gradient of a magnetic field. The systems include a first magnet and a second magnet mechanically coupled together and aligned along a polarization axis. The first magnet and the second magnet are positioned such that a pair of like magnetic poles of the first magnet and the second magnet face in opposite directions. Further, the first magnet and the second magnet are configured to move along the polarization axis in response to a magnetic field. A sensing system is configured to measure a change in a gradient of the magnetic field based on the movement of the first magnet and second magnet along the polarization axis in response to the magnetic field.
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公开(公告)号：US20230305082A1
公开(公告)日：2023-09-28
申请号：US18199185
申请日：2023-05-18
发明人： Joshua Javor , David Bishop , David Campbell , Matthias Imboden
IPC分类号： G01R33/022 , G01R33/038 , G01R33/00
CPC分类号： G01R33/022 , G01R33/038 , G01R33/0052 , G01R33/0385
摘要： A system and method of effectively measuring a change in a gradient of a magnetic field. The systems include a first magnet and a second magnet mechanically coupled together and aligned along a polarization axis. The first magnet and the second magnet are positioned such that a pair of like magnetic poles of the first magnet and the second magnet face in opposite directions. Further, the first magnet and the second magnet are configured to move along the polarization axis in response to a magnetic field. A sensing system is configured to measure a change in a gradient of the magnetic field based on the movement of the first magnet and second magnet along the polarization axis in response to the magnetic field.
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公开(公告)号：US20220291300A1
公开(公告)日：2022-09-15
申请号：US17692651
申请日：2022-03-11
发明人： Joshua Javor , David Bishop , David Campbell , Matthias Imboden
IPC分类号： G01R33/022 , G01R33/00 , G01R33/038
摘要： A system and method of effectively measuring a change in a gradient of a magnetic field. The systems include a first magnet and a second magnet mechanically coupled together and aligned along a polarization axis. The first magnet and the second magnet are positioned such that a pair of like magnetic poles of the first magnet and the second magnet face in opposite directions. Further, the first magnet and the second magnet are configured to move along the polarization axis in response to a magnetic field. A sensing system is configured to measure a change in a gradient of the magnetic field based on the movement of the first magnet and second magnet along the polarization axis in response to the magnetic field.
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