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公开(公告)号:US11816413B2
公开(公告)日:2023-11-14
申请号:US17370717
申请日:2021-07-08
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Li-Chung Hsu , Yen-Pin Chen , Sung-Yen Yeh , Jerry Chang-Jui Kao , Chung-Hsing Wang
IPC: G06F30/392 , G06F30/367 , G06F119/06 , G06F113/18
CPC classification number: G06F30/392 , G06F30/367 , G06F2113/18 , G06F2119/06
Abstract: Systems and methods for context aware circuit design are described herein. A method includes: identifying at least one cell to be designed into a circuit; identifying at least one context parameter having an impact to layout dependent effect of the circuit; generating, for each cell and for each context parameter, a plurality of abutment environments associated with the cell; estimating, for each cell and each context parameter, a sensitivity of at least one electrical property of the cell to the context parameter by generating a plurality of electrical property values of the cell under the plurality of abutment environments; and determining whether each context parameter is a key context parameter for a static analysis of the circuit, based on the sensitivity of the at least one electrical property of each cell and based on at least one predetermined threshold.
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公开(公告)号:US12175180B2
公开(公告)日:2024-12-24
申请号:US18232742
申请日:2023-08-10
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Li-Chung Hsu , Yen-Pin Chen , Sung-Yen Yeh , Jerry Chang-Jui Kao , Chung-Hsing Wang
IPC: G06F30/392 , G06F30/367 , G06F113/18 , G06F119/06
Abstract: Systems and methods for context aware circuit design are described herein. A method includes: identifying at least one cell to be designed into a circuit; identifying at least one context parameter having an impact to layout dependent effect of the circuit; generating, for each cell and for each context parameter, a plurality of abutment environments associated with the cell; estimating, for each cell and each context parameter, a sensitivity of at least one electrical property of the cell to the context parameter by generating a plurality of electrical property values of the cell under the plurality of abutment environments; and determining whether each context parameter is a key context parameter for a static analysis of the circuit, based on the sensitivity of the at least one electrical property of each cell and based on at least one predetermined threshold.
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公开(公告)号:US20210334447A1
公开(公告)日:2021-10-28
申请号:US17370717
申请日:2021-07-08
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Li-Chung Hsu , Yen-Pin Chen , Sung-Yen Yeh , Jerry Chang-Jui Kao , Chung-Hsing Wang
IPC: G06F30/392 , G06F30/367
Abstract: Systems and methods for context aware circuit design are described herein. A method includes: identifying at least one cell to be designed into a circuit; identifying at least one context parameter having an impact to layout dependent effect of the circuit; generating, for each cell and for each context parameter, a plurality of abutment environments associated with the cell; estimating, for each cell and each context parameter, a sensitivity of at least one electrical property of the cell to the context parameter by generating a plurality of electrical property values of the cell under the plurality of abutment environments; and determining whether each context parameter is a key context parameter for a static analysis of the circuit, based on the sensitivity of the at least one electrical property of each cell and based on at least one predetermined threshold.
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公开(公告)号:US11068637B1
公开(公告)日:2021-07-20
申请号:US16836370
申请日:2020-03-31
Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.
Inventor: Li-Chung Hsu , Yen-Pin Chen , Sung-Yen Yeh , Jerry Chang-Jui Kao , Chung-Hsing Wang
IPC: G06F30/392 , G06F30/367 , G06F119/06 , G06F113/18
Abstract: Systems and methods for context aware circuit design are described herein. A method includes: identifying at least one cell to be designed into a circuit; identifying at least one context parameter having an impact to layout dependent effect of the circuit; generating, for each cell and for each context parameter, a plurality of abutment environments associated with the cell; estimating, for each cell and each context parameter, a sensitivity of at least one electrical property of the cell to the context parameter by generating a plurality of electrical property values of the cell under the plurality of abutment environments; and determining whether each context parameter is a key context parameter for a static analysis of the circuit, based on the sensitivity of the at least one electrical property of each cell and based on at least one predetermined threshold.
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