公开(公告)号：US11816413B2

公开(公告)日：2023-11-14

申请号：US17370717

申请日：2021-07-08

Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.

Inventor： Li-Chung Hsu ,  Yen-Pin Chen ,  Sung-Yen Yeh ,  Jerry Chang-Jui Kao ,  Chung-Hsing Wang

IPC: G06F30/392 ,  G06F30/367 ,  G06F119/06 ,  G06F113/18

CPC classification number: G06F30/392 ,  G06F30/367 ,  G06F2113/18 ,  G06F2119/06

Abstract: Systems and methods for context aware circuit design are described herein. A method includes: identifying at least one cell to be designed into a circuit; identifying at least one context parameter having an impact to layout dependent effect of the circuit; generating, for each cell and for each context parameter, a plurality of abutment environments associated with the cell; estimating, for each cell and each context parameter, a sensitivity of at least one electrical property of the cell to the context parameter by generating a plurality of electrical property values of the cell under the plurality of abutment environments; and determining whether each context parameter is a key context parameter for a static analysis of the circuit, based on the sensitivity of the at least one electrical property of each cell and based on at least one predetermined threshold.

公开(公告)号：US12175180B2

公开(公告)日：2024-12-24

申请号：US18232742

申请日：2023-08-10

Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.

Inventor： Li-Chung Hsu ,  Yen-Pin Chen ,  Sung-Yen Yeh ,  Jerry Chang-Jui Kao ,  Chung-Hsing Wang

IPC: G06F30/392 ,  G06F30/367 ,  G06F113/18 ,  G06F119/06

Abstract: Systems and methods for context aware circuit design are described herein. A method includes: identifying at least one cell to be designed into a circuit; identifying at least one context parameter having an impact to layout dependent effect of the circuit; generating, for each cell and for each context parameter, a plurality of abutment environments associated with the cell; estimating, for each cell and each context parameter, a sensitivity of at least one electrical property of the cell to the context parameter by generating a plurality of electrical property values of the cell under the plurality of abutment environments; and determining whether each context parameter is a key context parameter for a static analysis of the circuit, based on the sensitivity of the at least one electrical property of each cell and based on at least one predetermined threshold.

公开(公告)号：US20210334447A1

公开(公告)日：2021-10-28

申请号：US17370717

申请日：2021-07-08

Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.

Inventor： Li-Chung Hsu ,  Yen-Pin Chen ,  Sung-Yen Yeh ,  Jerry Chang-Jui Kao ,  Chung-Hsing Wang

IPC: G06F30/392 ,  G06F30/367

Abstract: Systems and methods for context aware circuit design are described herein. A method includes: identifying at least one cell to be designed into a circuit; identifying at least one context parameter having an impact to layout dependent effect of the circuit; generating, for each cell and for each context parameter, a plurality of abutment environments associated with the cell; estimating, for each cell and each context parameter, a sensitivity of at least one electrical property of the cell to the context parameter by generating a plurality of electrical property values of the cell under the plurality of abutment environments; and determining whether each context parameter is a key context parameter for a static analysis of the circuit, based on the sensitivity of the at least one electrical property of each cell and based on at least one predetermined threshold.

公开(公告)号：US11068637B1

公开(公告)日：2021-07-20

申请号：US16836370

申请日：2020-03-31

Applicant: Taiwan Semiconductor Manufacturing Co., Ltd.

Inventor： Li-Chung Hsu ,  Yen-Pin Chen ,  Sung-Yen Yeh ,  Jerry Chang-Jui Kao ,  Chung-Hsing Wang

IPC: G06F30/392 ,  G06F30/367 ,  G06F119/06 ,  G06F113/18

Abstract: Systems and methods for context aware circuit design are described herein. A method includes: identifying at least one cell to be designed into a circuit; identifying at least one context parameter having an impact to layout dependent effect of the circuit; generating, for each cell and for each context parameter, a plurality of abutment environments associated with the cell; estimating, for each cell and each context parameter, a sensitivity of at least one electrical property of the cell to the context parameter by generating a plurality of electrical property values of the cell under the plurality of abutment environments; and determining whether each context parameter is a key context parameter for a static analysis of the circuit, based on the sensitivity of the at least one electrical property of each cell and based on at least one predetermined threshold.