APPARATUS AND METHOD FOR CLEANING RETICLE STAGE

    公开(公告)号:US20190155178A1

    公开(公告)日:2019-05-23

    申请号:US15902528

    申请日:2018-02-22

    Abstract: An apparatus for cleaning an electrostatic reticle holder used in a lithography system includes a chamber for providing a low pressure environment for the electrostatic reticle holder and an ultrasound transducer configured to apply ultrasound waves to the electrostatic reticle holder. The apparatus further includes a controller configured to control the ultrasound transducer and a gas flow controller. The gas flow controller is configured to enable pressurizing or depressurizing the chamber.

    APPARATUS AND METHOD FOR CLEANING RETICLE STAGE

    公开(公告)号:US20200310258A1

    公开(公告)日:2020-10-01

    申请号:US16902087

    申请日:2020-06-15

    Abstract: An apparatus for cleaning an electrostatic reticle holder used in a lithography system includes a chamber for providing a low pressure environment for the electrostatic reticle holder and an ultrasound transducer configured to apply ultrasound waves to the electrostatic reticle holder. The apparatus further includes a controller configured to control the ultrasound transducer and a gas flow controller. The gas flow controller is configured to enable pressurizing or depressurizing the chamber.

    METHOD FOR CREATING VACUUM IN LOAD LOCK CHAMBER

    公开(公告)号:US20180364596A1

    公开(公告)日:2018-12-20

    申请号:US15622483

    申请日:2017-06-14

    Abstract: A method for creating a vacuum in a load lock chamber is provided. The method includes building an air-tight environment in the load lock chamber. The method further includes reducing the pressure in a gas tank to a predetermined vacuum pressure. The method also includes enabling an exchange of gas between the load lock chamber and the gas tank when the pressure in the gas tank is at the predetermined vacuum pressure so as to reduce the pressure in the load lock chamber to an adjusted vacuum pressure.

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