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公开(公告)号:US08164324B2
公开(公告)日:2012-04-24
申请号:US12505057
申请日:2009-07-17
IPC分类号: G01P3/48
CPC分类号: G01B7/30 , G01D5/145 , G01D5/24452 , G01D5/24476 , G01D5/2448
摘要: A rotation sensor includes a detecting portion, a rotational state determining portion and a pulse generating portion. The detecting portion detects a rotation of a rotational member and outputs a detection signal. The rotational state determining portion determines a rotational state of the rotational member on the basis of the detection signal in a predetermined period. The pulse generating portion generates and outputs a first pulse and a second pulse, of which waveforms differ from each other, in response to a rotational direction of the rotational member after the predetermined period. The pulse generating portion further generates and outputs a third pulse regardless of the rotational state of the rotational member in the predetermined period.
摘要翻译: 旋转传感器包括检测部分,旋转状态确定部分和脉冲产生部分。 检测部分检测旋转构件的旋转并输出检测信号。 旋转状态判定部根据检测信号,在规定期间内确定旋转部件的旋转状态。 脉冲发生部分响应于旋转部件的旋转方向在预定时间段之后产生并输出其波形彼此不同的第一脉冲和第二脉冲。 脉冲发生部分在预定周期内进一步产生并输出第三脉冲,而不管旋转构件的旋转状态如何。
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公开(公告)号:US20130116945A1
公开(公告)日:2013-05-09
申请号:US13290293
申请日:2011-11-07
申请人: Glenn A. Forrest , Aaron Cook , Dana Briere , Devon Fernandez , Naota Nakayama
发明人: Glenn A. Forrest , Aaron Cook , Dana Briere , Devon Fernandez , Naota Nakayama
IPC分类号: G06F19/00
CPC分类号: G01R31/318552 , G01R31/318594
摘要: An integrated circuit sensor includes circuitry and methods for generating a high speed delay fault test clock signal. A trimmable oscillator generates a master clock signal for use by an output protocol processor to provide the sensor output signal. A fault test clock signal generator is responsive to the master clock signal and to a test trigger signal for generating the test clock signal having a launch pulse and a capture pulse, each having edges substantially coincident with like edges of pulses of the master clock signal and a spacing between launch and capture pulses established by the trimmable master clock signal.
摘要翻译: 集成电路传感器包括用于产生高速延迟故障测试时钟信号的电路和方法。 可调谐振荡器产生主时钟信号,供输出协议处理器使用以提供传感器输出信号。 故障测试时钟信号发生器响应主时钟信号和测试触发信号,用于产生具有发射脉冲和捕获脉冲的测试时钟信号,每个具有与主时钟信号的脉冲的相似边缘基本一致的边沿, 由可调整主时钟信号建立的发射和捕获脉冲之间的间距。
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公开(公告)号:US09513337B2
公开(公告)日:2016-12-06
申请号:US13290293
申请日:2011-11-07
申请人: Glenn A. Forrest , Aaron Cook , Dana Briere , Devon Fernandez , Naota Nakayama
发明人: Glenn A. Forrest , Aaron Cook , Dana Briere , Devon Fernandez , Naota Nakayama
IPC分类号: G01R31/3185
CPC分类号: G01R31/318552 , G01R31/318594
摘要: An integrated circuit sensor includes circuitry and methods for generating a high speed delay fault test clock signal. A trimmable oscillator generates a master clock signal for use by an output protocol processor to provide the sensor output signal. A fault test clock signal generator is responsive to the master clock signal and to a test trigger signal for generating the test clock signal having a launch pulse and a capture pulse, each having edges substantially coincident with like edges of pulses of the master clock signal and a spacing between launch and capture pulses established by the trimmable master clock signal.
摘要翻译: 集成电路传感器包括用于产生高速延迟故障测试时钟信号的电路和方法。 可调谐振荡器产生主时钟信号,供输出协议处理器使用以提供传感器输出信号。 故障测试时钟信号发生器响应主时钟信号和测试触发信号,用于产生具有发射脉冲和捕获脉冲的测试时钟信号,每个具有与主时钟信号的脉冲的相似边缘基本一致的边沿, 由可调整主时钟信号建立的发射和捕获脉冲之间的间距。
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