摘要:
A device for polishing the peripheral edge part of a semiconductor wafer includes a wafer stage for holding the wafer, a wafer stage unit including devices for rotating the wafer stage, causing the wafer stage to undergo a rotary reciprocating motion within the same plane as the surface of the wafer stage, and moving the wafer stage parallel to the surface, a notch polishing part for polishing the notch on the wafer and a bevel polishing part for polishing the beveled part of the wafer. Pure water is supplied to the wafer to prevent it from becoming dry as it is transported from the notch polishing part to the bevel polishing part.
摘要:
A device for polishing the peripheral edge part of a semiconductor wafer includes a wafer stage for holding the wafer, a wafer stage unit including devices for rotating the wafer stage, causing the wafer stage to undergo a rotary reciprocating motion within the same plane as the surface of the wafer stage, and moving the wafer stage parallel to the surface, a notch polishing part for polishing the notch on the wafer and a bevel polishing part for polishing the beveled part of the wafer. Pure water is supplied to the wafer to prevent it from becoming dry as it is transported from the notch polishing part to the bevel polishing part.
摘要:
A polishing machine uses a polishing head having a movable pad to press a polishing tape for polishing beveled and edge parts of a disk-shaped object. A rotary shaft is connected to the polishing head in a direction of contact surface between the polishing tape and the object. A rotary-and-reciprocating motion device rotates the polishing head around the axial line of the rotary shaft and moves it reciprocatingly along its axial line. A moving device undergoes a reciprocating motion perpendicularly to the object surface while supporting the object. When in use, the polishing head is rotated while the pad causes the polishing tape to protrude from it while the object is rotated.
摘要:
A polishing machine uses a polishing head having a movable pad to press a polishing tape for polishing beveled and edge parts of a disk-shaped object. A rotary shaft is connected to the polishing head in a direction of contact surface between the polishing tape and the object. A rotary-and-reciprocating motion device rotates the polishing head around the axial line of the rotary shaft and moves it reciprocatingly along its axial line. A moving device undergoes a reciprocating motion perpendicularly to the object surface while supporting the object. When in use, the polishing head is rotated while the pad causes the polishing tape to protrude from it while the object is rotated.
摘要:
A probe cleaner for removing foreign objects from the tip part of a probe is formed with a cleaner sheet having a surface part with microfibers and abrading particles affixed to the surface of the microfibers at this surface part. The average fiber diameter of the microfibers is in the range of 0.1 μm or more and 20 μm or less. The average particle diameter of the abrading particles is in the range of 0.05 μm or more and 3.0 μm or less. For cleaning the tip part of a probe, the probe cleaner is set to the surface of a table, the tip part of the probe is caused to penetrate inside the surface part, and the probe is caused to undergo a reciprocal motion in the direction of the thickness of the surface part.
摘要:
A circular polishing pad has grooves formed on the surface in a spiral pattern with its center point offset from the center of the pad. The spiral pattern is an Archimedean spiral pattern or a parabolic spiral pattern. A target object is polished by using such a polishing pad without oscillating the platen to which the polishing pad is pasted or the polishing head that holds the target object.
摘要:
A probe cleaning sheet for removing foreign objects attached to tip part of a probe is formed with a plastic sheet having a flat and even surface and a uniform thickness and a cleaning layer with a flat and even surface and a uniform thickness formed on the surface of this plastic sheet. The cleaning layer has viscoelastic properties. Its Young's modulus is 30 MPa or more and 700 MPa les less, its storage modulus at 25° C. is 1.2×108 dyn/cm2 or more and 1.2×109 dyn/cm2 or less, and the value of its storage modulus at 25° C. is 1.2 or more and 3.0 or less times the value of its storage modulus at 150° C.
摘要翻译:用于去除附着在探针的尖端部分上的异物的探针清洁片由具有平坦且均匀的表面和均匀厚度的塑料片形成,并且具有平坦且均匀的表面和均匀厚度的清洁层,其形成在 这个塑料片。 清洁层具有粘弹性。 其杨氏模量为30MPa以上且700MPa以下,其在25℃下的储能模量为1.2×10 8 / cm 2以上且1.2×10 3, SUP> 9Dyn / cm 2以下,其在25℃下的储能模量值为其在150℃下的储能模量值的1.2倍以上且3.0以下 C。
摘要:
A circular polishing pad has grooves formed on the surface in a spiral pattern with its center point offset from the center of the pad. The spiral pattern is an Archimedean spiral pattern or a parabolic spiral pattern. A target object is polished by using such a polishing pad without oscillating the platen to which the polishing pad is pasted or the polishing head that holds the target object.
摘要:
A polishing pad has a resin sheet having a flat surface and abrading particles fixed inside and on the surface of this resin sheet. Its tensile strength is in the range of 30 MPa or greater and 70 MPa or less and preferably in the range of 40 MPa or greater and 60 MPa or less. Its tensile tear elongation is in the range of 50% or less, preferably 20% or less and more preferably 5% or less. The average diameter of the primary particles of the abrading particles is in the range of 0.005 μm or greater and less than 0.5 μm, and preferably in the range of 0.005 μm or greater and 0.2 μm or less. The content of the abrading particles fixed to the resin sheet is 10 volume % or greater and 50 volume % or less, or preferably 10 volume % or greater and 24 volume or less.
摘要:
A polishing pad has a resin sheet having a flat surface and abrading particles fixed inside and on the surface of this resin sheet. Its tensile strength is in the range of 30MPa or greater and 70 MPa or less and preferably in the range of 40MPa or greater and 60MPa or less. Its tensile tear elongation is in the range of 50% or less, preferably 20% or less and more preferably 5% or less. The average diameter of the primary particles of the abrading particles is in the range of 0.005 μm or greater and less than 0.5 μm, and preferably in the range of 0.005 μm or greater and 0.2 μm or less. The content of the abrading particles fixed to the resin sheet is 10 volume % or greater and 50 volume % or less, or preferably 10 volume % or greater and 24 volume or less.