公开(公告)号：US20140103951A1

公开(公告)日：2014-04-17

申请号：US13649303

申请日：2012-10-11

Applicant: Tektronix, Inc.

Inventor： Daniel G. KNIERIM ,  William A. HAGERUP ,  Barton T. HICKMAN ,  Ira G. Pollock

IPC: G01R31/04 ,  G06F19/00 ,  G01R1/067

CPC classification number: G01R1/06788 ,  G01R1/06766 ,  G01R1/06794 ,  G01R31/024 ,  G01R31/026

Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

Abstract translation: 测试系统可以包括适于耦合在测试测量设备和被测设备（DUT）之间的探头。 探头可以包括用于从DUT接收有效信号的信号输入和用于向测试测量装置提供有源信号的信号输出。 探头还可以包括一个连接到DUT地的输入接地和一个连接到测试测量设备地的输出地。 探头接地连接检查装置可以自动确定探头接地与DUT接地和测试测量设备接地是否牢固。