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    Signal acquisition system having reduced probe loading of a device under test
    1.
    发明授权
    Signal acquisition system having reduced probe loading of a device under test 有权
    信号采集系统具有减少被测设备的探头负载

    公开(公告)号：US08723530B2

    公开(公告)日：2014-05-13

    申请号：US13854566

    申请日：2013-04-01

    Applicant: Tektronix, Inc.

    Inventor： Josiah A. Bartlett ,  Ira G. Pollock ,  Daniel G. Knierim ,  Lester L. Larson ,  Scott R. Jansen ,  Kenneth P. Dobyns ,  Michael Duane Stevens

    IPC: G01R35/00

    CPC classification number: G01R35/005 ,  G01R1/06766

    Abstract: A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth.

    Abstract translation: 信号采集系统具有信号采集探针，其具有耦合到电阻中心导体信号电缆的探针尖端电路。 信号采集探头的电阻中心导体信号电缆通过输入节点和信号处理仪器中的输入电路耦合到信号处理仪器中的补偿系统。 信号采集探头和信号处理仪器在输入节点处具有不匹配的时间常数，补偿系统提供极零对，以保持信号采集系统频率带宽的平坦度。

    Automatic probe ground connection checking techniques
    2.
    发明授权
    Automatic probe ground connection checking techniques 有权

    公开(公告)号：US11454651B2

    公开(公告)日：2022-09-27

    申请号：US17114468

    申请日：2020-12-07

    Applicant: Tektronix, Inc.

    Inventor： Daniel G. Knierim ,  William A. Hagerup ,  Barton T. Hickman ,  Ira G. Pollock

    IPC: G01R1/067 ,  G01R31/50 ,  G01R31/54

    Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

    Automatic probe ground connection checking techniques
    5.
    发明授权
    Automatic probe ground connection checking techniques 有权
    自动探头接地连接检查技术

    公开(公告)号：US09194888B2

    公开(公告)日：2015-11-24

    申请号：US13649303

    申请日：2012-10-11

    Applicant: Tektronix, Inc.

    Inventor： Daniel G. Knierim ,  William A. Hagerup ,  Barton T. Hickman ,  Ira G. Pollock

    IPC: G01R31/04 ,  G01R1/067 ,  G06F19/00 ,  G01R31/02

    CPC classification number: G01R1/06788 ,  G01R1/06766 ,  G01R1/06794 ,  G01R31/024 ,  G01R31/026

    Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

    Abstract translation: 测试系统可以包括适于耦合在测试测量设备和被测设备（DUT）之间的探头。 探头可以包括用于从DUT接收有效信号的信号输入和用于向测试测量装置提供有源信号的信号输出。 探头还可以包括一个连接到DUT地的输入接地和一个连接到测试测量设备地的输出地。 探头接地连接检查装置可以自动确定探头接地与DUT接地和测试测量设备接地是否牢固。

    HIGH IMPEDANCE COMPLIANT PROBE TIP
    8.
    发明申请
    HIGH IMPEDANCE COMPLIANT PROBE TIP 审中-公开
    高阻抗合规探头

    公开(公告)号：US20160291054A1

    公开(公告)日：2016-10-06

    申请号：US14676703

    申请日：2015-04-01

    Applicant: Tektronix, Inc.

    Inventor： William A. Hagerup ,  Julie A. Campbell ,  Ira G. Pollock ,  James E. Spinar ,  Kathleen F.M. Ullom ,  Charles M. Hartmann ,  Daniel J. Ayres ,  Christina D. Enns

    IPC: G01R1/067

    CPC classification number: G01R1/06722 ,  G01R1/06733 ,  G01R1/06788

    Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element coupled with the plunger component at one end and with the tip component at the opposite end, the resistive/impedance element including at least one rod having a semi-cylindrical form and a resistive material situated thereon.

    Abstract translation: 测试探针尖端可以包括顺应性构件或力偏转组件和尖端部件。 柔性构件或力偏转组件可以包括柱塞部件和容纳柱塞部件的筒部件，其中柱塞部件构造成在筒部件内部轴向滑动。 测试探针尖端还可以包括在筒部件内作用在柱塞部件上的弹簧机构，以及在一端与柱塞部件耦合的电阻/阻抗元件，并且在相对端与尖端部件耦合，电阻/阻抗元件 包括至少一个具有半圆柱形状的杆和位于其上的电阻材料。

    HIGH IMPEDANCE COMPLIANT PROBE TIP
    9.
    发明申请
    HIGH IMPEDANCE COMPLIANT PROBE TIP 有权
    高阻抗合规探头

    公开(公告)号：US20160187382A1

    公开(公告)日：2016-06-30

    申请号：US14587703

    申请日：2014-12-31

    Applicant: Tektronix, Inc.

    Inventor： Julie A. Campbell ,  Ira G. Pollock ,  William A. Hagerup ,  Christina D. Enns

    IPC: G01R1/067

    CPC classification number: G01R1/06772 ,  G01R1/06722 ,  G01R1/06766 ,  G01R1/073 ,  G05G1/00 ,  H01L21/00 ,  H01R13/2421 ,  H01R2101/00 ,  H01R2201/20 ,  H03F1/00

    Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element, e.g., a round rod resistor, coupled with the plunger component at one end and with the tip component at the opposite end.

    Abstract translation: 测试探针尖端可以包括顺应性构件或力偏转组件和尖端部件。 柔性构件或力偏转组件可以包括柱塞部件和容纳柱塞部件的筒部件，其中柱塞部件构造成在筒部件内部轴向滑动。 测试探针尖端还可以包括在筒部件内作用于柱塞部件上的弹簧机构，以及阻塞/阻抗元件，例如圆棒电阻器，其一端与柱塞部件耦合，并且在尖端部件处于 对面

    AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES
    10.
    发明申请
    AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES 审中-公开
    自动探头接地检查技术

    公开(公告)号：US20160077128A1

    公开(公告)日：2016-03-17

    申请号：US14949562

    申请日：2015-11-23

    Applicant: Tektronix, Inc.

    Inventor： Daniel G. Knierim ,  William A. Hagerup ,  Barton T. Hickman ,  Ira G. Pollock

    IPC: G01R1/067 ,  G01R31/02

    CPC classification number: G01R1/06788 ,  G01R1/06766 ,  G01R1/06794 ,  G01R31/024 ,  G01R31/026

    Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

    Abstract translation: 测试系统可以包括适于耦合在测试测量设备和被测设备（DUT）之间的探头。 探头可以包括用于从DUT接收有效信号的信号输入和用于向测试测量装置提供有源信号的信号输出。 探头还可以包括一个连接到DUT地的输入接地和一个连接到测试测量设备地的输出地。 探头接地连接检查装置可以自动确定探头接地与DUT接地和测试测量设备接地是否牢固。

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