公开(公告)号：US20200166546A1

公开(公告)日：2020-05-28

申请号：US16695795

申请日：2019-11-26

Applicant: Tektronix, Inc.

Inventor： Joshua J. O'Brien ,  Brian S. Mantel

IPC: G01R13/02 ,  G06N3/04

Abstract: A method of classifying waveform data includes receiving input waveform data at a test and measurement system, accessing a repository of reference waveform data and corresponding classes, analyzing the input waveform data and the reference waveform data to designate a class of the input waveform data, and using the class designation to provide information to a user. A test and measurement system has a user interface, at least one input port, a communications port, a processor, the processor configured to execute instructions causing the processor to: receive input waveform data through at least one of the input port or the user interface; access a repository of reference waveform data; analyze the input waveform data using the reference waveform data; designate a class of the input waveform data; and use the class to provide information to the user about the input waveform.

公开(公告)号：US11181552B2

公开(公告)日：2021-11-23

申请号：US16695795

申请日：2019-11-26

Applicant: Tektronix, Inc.

Inventor： Joshua J. O'Brien ,  Brian S. Mantel

IPC: G01R13/02 ,  G01R13/22 ,  G06N3/04

Abstract: A method of classifying waveform data includes receiving input waveform data at a test and measurement system, accessing a repository of reference waveform data and corresponding classes, analyzing the input waveform data and the reference waveform data to designate a class of the input waveform data, and using the class designation to provide information to a user. A test and measurement system has a user interface, at least one input port, a communications port, a processor, the processor configured to execute instructions causing the processor to: receive input waveform data through at least one of the input port or the user interface; access a repository of reference waveform data; analyze the input waveform data using the reference waveform data; designate a class of the input waveform data; and use the class to provide information to the user about the input waveform.

公开(公告)号：US20210081592A1

公开(公告)日：2021-03-18

申请号：US17024529

申请日：2020-09-17

Applicant: Tektronix, Inc.

Inventor： Jonathan S. Dandy ,  Brian S. Mantel

IPC: G06F30/367 ,  G06N20/00 ,  G06F119/08

Abstract: A method for improving the accuracy of simulation models can include measuring a characteristic value at one or more nodes of a physical embodiment corresponding to the simulation model; inputting the measured characteristic value into a trained machine learning facility corresponding to the simulation model; and receiving from the trained machine learning facility one or more predicted values based at least in part on the inputted measured characteristic value.