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公开(公告)号：US10996178B2
公开(公告)日：2021-05-04
申请号：US15693371
申请日：2017-08-31
Applicant: Tektronix, Inc.
Inventor： Jonathan S. Dandy , Daniel G. Knierim
Abstract: Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier in the instrument prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.
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公开(公告)号：US20190011481A1
公开(公告)日：2019-01-10
申请号：US15842654
申请日：2017-12-14
Applicant: Tektronix, Inc.
Inventor： Jonathan S. Dandy
Abstract: Disclosed is a test and measurement probe including a signal channel having an input series resistor with a series parasitic capacitance. The probe also includes an amplifier coupled to the signal channel. The amplifier includes a shunt parasitic capacitance. A variable shunt resistor is coupled to the signal channel and a ground. The variable shunt resistor can be set to match a resistance capacitance (RC) value associated with the series parasitic capacitance and the shunt. The probe can also include a variable series resistor coupled to the amplifier. The variable series resistor can be set to adjust for attenuation variation associated with the variable shunt resistor. Other embodiments may be described and/or claimed herein.
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公开(公告)号：US11768161B2
公开(公告)日：2023-09-26
申请号：US17307989
申请日：2021-05-04
Applicant: Tektronix, Inc.
Inventor： Jonathan S. Dandy , Daniel G. Knierim
Abstract: Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier in the instrument prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.
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Patent Agency Ranking
公开(公告)号：US20180372655A1
公开(公告)日：2018-12-27
申请号：US15693371
申请日：2017-08-31
Applicant: Tektronix, Inc.
Inventor： Jonathan S. Dandy , Daniel G. Knierim
IPC: G01N22/00
Abstract: Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier in the instrument prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.
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公开(公告)号：US20230408424A1
公开(公告)日：2023-12-21
申请号：US18457630
申请日：2023-08-29
Applicant: Tektronix, Inc.
Inventor： Jonathan S. Dandy , Daniel G. Knierim
Abstract: Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.
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公开(公告)号：US20210255118A1
公开(公告)日：2021-08-19
申请号：US17307989
申请日：2021-05-04
Applicant: Tektronix, Inc.
Inventor： Jonathan S. Dandy , Daniel G. Knierim
Abstract: Disclosed is a signal isolating test instrument, such as an electronics test probe. The instrument includes an input to receive a floating analog signal. An upconverter is employed to modulate the floating analog signal to a microwave frequency analog signal. An isolation barrier in the instrument prevents coupling of the floating analog signal to an earth ground. The instrument employs a microwave structure to transmit the microwave frequency analog signal across the isolation barrier via electromagnetic coupling. A downconverter is then employed to demodulate the microwave frequency analog signal to obtain a ground referenced test signal corresponding to the floating analog signal.
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公开(公告)号：US11079407B2
公开(公告)日：2021-08-03
申请号：US15842654
申请日：2017-12-14
Applicant: Tektronix, Inc.
Inventor： Jonathan S. Dandy
Abstract: Disclosed is a test and measurement probe including a signal channel having an input series resistor with a series parasitic capacitance. The probe also includes an amplifier coupled to the signal channel. The amplifier includes a shunt parasitic capacitance. A variable shunt resistor is coupled to the signal channel and a ground. The variable shunt resistor can be set to match a resistance capacitance (RC) value associated with the series parasitic capacitance and the shunt. The probe can also include a variable series resistor coupled to the amplifier. The variable series resistor can be set to adjust for attenuation variation associated with the variable shunt resistor. Other embodiments may be described and/or claimed herein.
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公开(公告)号：US20210081592A1
公开(公告)日：2021-03-18
申请号：US17024529
申请日：2020-09-17
Applicant: Tektronix, Inc.
Inventor： Jonathan S. Dandy , Brian S. Mantel
IPC: G06F30/367 , G06N20/00 , G06F119/08
Abstract: A method for improving the accuracy of simulation models can include measuring a characteristic value at one or more nodes of a physical embodiment corresponding to the simulation model; inputting the measured characteristic value into a trained machine learning facility corresponding to the simulation model; and receiving from the trained machine learning facility one or more predicted values based at least in part on the inputted measured characteristic value.
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