公开(公告)号：US20240353447A1

公开(公告)日：2024-10-24

申请号：US18645352

申请日：2024-04-24

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Josiah A. Bartlett ,  Charles Adrian Hwang ,  Mark A. Norris

IPC: G01R13/02

CPC classification number: G01R13/0218

Abstract: A test and measurement instrument having an integrated analog front end that includes one or more amplifiers, the one or more amplifiers implemented on a high-speed amplifier integrated circuit die, a controlled-impedance signal path between an input and a reference voltage, the controlled-impedance signal path including one or more signal taps and one or more controlled-impedance attenuator stages, the one or more controlled-impedance attenuator stages implemented on the amplifier integrated circuit die, and a switching network structured to selectively couple a signal tap of the controlled-impedance signal path to a respective amplifier of the one or more amplifiers, the switching network implemented on the amplifier integrated circuit die