Shielded Probe Tip Interface
    2.
    发明申请

    公开(公告)号:US20180328962A1

    公开(公告)日:2018-11-15

    申请号:US15687316

    申请日:2017-08-25

    CPC classification number: G01R1/18 G01R1/0416 G01R1/06738 G01R1/06772

    Abstract: Disclosed is a differential test probe tip. The probe tip comprises a socket of electrically conductive material at a proximate end of the probe tip. The socket includes a concavity to receive a signal pin. The probe tip also comprises a reference body of conductive material surrounding the socket. The probe tip further comprises a insulating spacer element of non-conductive material surrounding the reference body at the proximate end of the probe tip. The insulating spacer element includes a signal port to receive the signal pin into the socket. The insulating spacer element further includes a reference port to receive a reference pin and maintain the reference pin in electrical communication with a proximate end of the reference body.

    Shielded probe tip interface
    3.
    发明授权

    公开(公告)号:US10753961B2

    公开(公告)日:2020-08-25

    申请号:US15687316

    申请日:2017-08-25

    Abstract: Disclosed is a differential test probe tip. The probe tip comprises a socket of electrically conductive material at a proximate end of the probe tip. The socket includes a concavity to receive a signal pin. The probe tip also comprises a reference body of conductive material surrounding the socket. The probe tip further comprises a insulating spacer element of non-conductive material surrounding the reference body at the proximate end of the probe tip. The insulating spacer element includes a signal port to receive the signal pin into the socket. The insulating spacer element further includes a reference port to receive a reference pin and maintain the reference pin in electrical communication with a proximate end of the reference body.

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