公开(公告)号：US20160334833A1

公开(公告)日：2016-11-17

申请号：US14814137

申请日：2015-07-30

Applicant: Tektronix, Inc.

Inventor： Ganesh K. Kumar ,  Krishna N H Sri ,  Madhusudhan Acharya ,  Kamlesh Mishra

IPC: G06F1/10

CPC classification number: G06F1/10 ,  G01R31/31709 ,  G01R31/3171

Abstract: A system for dynamically calibrating operational parameters of a Device Under Test (DUT) includes a signal generator for generating a data pattern, a DUT structured to generate a clock signal, an oscilloscope structured to measure margins of the generated clock signal compared to an eye-diagram produced on the oscilloscope from the data pattern, and a calibration unit. The calibration unit can produce a candidate a jitter value for the signal generator, receive a determination from the oscilloscope whether the data pattern generated with the candidate jitter value causes the DUT to produce the generated clock signal within a pre-determined tolerance level, and modify the jitter value accordingly. The calibration unit may also be further structured to generate voltage swing values.

Abstract translation: 用于动态校准被测设备（DUT）的操作参数的系统包括用于产生数据模式的信号发生器，被构造成产生时钟信号的DUT，被构造为测量所生成的时钟信号的边缘的示波器， 在示波器上从数据模式生成的图和校准单元。 校准单元可以产生候选信号发生器的抖动值，接收来自示波器的确定，用候选抖动值产生的数据模式是否使DUT在预定的公差电平内产生产生的时钟信号，并修改 抖动值相应。 校准单元还可以进一步构造成产生电压摆​​幅值。

公开(公告)号：US09618965B2

公开(公告)日：2017-04-11

申请号：US14814137

申请日：2015-07-30

Applicant: Tektronix, Inc.

Inventor： Ganesh K. Kumar ,  Krishna N H Sri ,  Madhusudhan Acharya ,  Kamlesh Mishra

IPC: G06F1/10 ,  G06F1/04 ,  H03K5/135

CPC classification number: G06F1/10 ,  G01R31/31709 ,  G01R31/3171

Abstract: A system for dynamically calibrating operational parameters of a Device Under Test (DUT) includes a signal generator for generating a data pattern, a DUT structured to generate a clock signal, an oscilloscope structured to measure margins of the generated clock signal compared to an eye-diagram produced on the oscilloscope from the data pattern, and a calibration unit. The calibration unit can produce a candidate a jitter value for the signal generator, receive a determination from the oscilloscope whether the data pattern generated with the candidate jitter value causes the DUT to produce the generated clock signal within a pre-determined tolerance level, and modify the jitter value accordingly. The calibration unit may also be further structured to generate voltage swing values.