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公开(公告)号：US20240353470A1
公开(公告)日：2024-10-24
申请号：US18641314
申请日：2024-04-19
申请人： Tektronix, Inc.
发明人： Niranjan R. Hegde , Daniel G. Knierim , Vivek Shivaram , Krishna N H Sri , Joshua J. O'Brien , Shubha B , Yogesh M. Pai
IPC分类号： G01R31/26
CPC分类号： G01R31/2621
摘要： A test and measurement system includes a device under test (DUT) interface structured to couple to at least one DUT and a measurement instrument coupled to the interface. The instrument includes one or more processors configured to, when testing the DUT, accept a measurement signal at a first input channel and generate a first sample waveform from the measurement signal using a first set of parameters, accept the measurement signal at a second input channel and generate a second sample from the measurement signal using a second set of parameters, and generate a measurement waveform from a combination of the first sample waveform and the second sample waveform. Additionally, the measurement instrument is structured to determine settling errors in the first pulse of a double-pulse test, and then compensate measurements made in subsequent pulses for the settling errors.
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公开(公告)号：US20230133047A1
公开(公告)日：2023-05-04
申请号：US17976644
申请日：2022-10-28
申请人： Tektronix, Inc.
发明人： Vivek Shivaram , Niranjan R Hegde , Parjanya Adiga , Krishna N H Sri , Tsuyoshi Miyazaki , Yogesh M. Pai , Venkatraj Melinamane
IPC分类号： G01R31/28
摘要： A test and measurement instrument has a user interface, one or more probes to connect to a device under test (DUT), and one or more processors configured to execute code to cause the one or more processors to: receive waveform data from the DUT after activation of the DUT by application of power from a power supply, and application of at least a first and second pulse from a source instrument, locate one or more reverse recovery regions in the waveform data, determine a reverse recovery time for the DUT from the reverse recovery region, and display a reverse recovery plot of the one or more reverse recovery regions on the user interface, the reverse recovery plot being automatically configured to display one or more of the reverse recovery regions, and including at least one characteristic for the one or more reverser recovery regions annotated on the reverse recovery plot. A method of providing reverse recovery measurements for a device under test (DUT) includes receiving waveform data through the probes from the DUT after activation of the DUT by application of power from a power supply, and application of a first and second pulse from a source instrument, locating one or more reverse recovery regions in the waveform data, determining a reverse recovery time for the DUT for the one or more reverse recovery regions, and displaying a reverse recovery plot of the one or more reverse recovery regions on the user interface, the reverse recovery plot being automatically configured to display the one or more reverse recovery regions, and including at least one characteristic of the one or more reverse recovery regions annotated on the reverse recovery plot.
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公开(公告)号：US20240036143A1
公开(公告)日：2024-02-01
申请号：US18359789
申请日：2023-07-26
申请人： Tektronix, Inc.
发明人： Shubha B , Krishna N H Sri , Sathish Kumar K , Yogesh M. Pai
CPC分类号： G01R35/005 , G01R31/2601
摘要： A system for measuring characteristics of wide bandgap Devices Under Test (DUTs) includes a testing fixture including one or more wide bandgap DUTs, and a measurement instrument having one or more processors configured to apply a stimulus to provoke a response of one or more wide bandgap DUTs, measure the response, graph the response on one or more displays, each display having a vertical scale, and automatically adjusting the vertical scale of the one or more displays until no clipping occurs in the one or more displays. Methods of dynamically configuring a test and measurement instrument based on a particular testing setup are also described.
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公开(公告)号：US20240027513A1
公开(公告)日：2024-01-25
申请号：US18220222
申请日：2023-07-10
申请人： Tektronix, Inc.
发明人： Vivek Shivaram , Niranjan R. Hedge , Shubha B , Krishna N H Sri , Yogesh M. Pai , Venkatraj Melinamane
IPC分类号： G01R31/26
CPC分类号： G01R31/2608
摘要： A system for determining an amount of time skew between two measurement probes includes a first probe and a second probe and one or more processors configured to measure a current signal from a Device Under Test (DUT) through the first probe, measure a voltage signal from the DUT through the second probe, generate a modeled voltage signal from the measured current signal, compare the modeled voltage signal to the measured voltage signal, and determine the amount of time skew between the first and the second probe from the compared signals. Methods are also described.
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5.发明公开公开(公告)号：US20240044968A1
公开(公告)日：2024-02-08
申请号：US18361672
申请日：2023-07-28
申请人： Tektronix, Inc.
发明人： Vivek Shivaram , Niranjan R. Hegde , Krishna N H Sri , Abhishek Naik , Shubha B , Yogesh M. Pai , Venkatraj Melinamane
CPC分类号： G01R31/2603 , G01R31/2889 , G01R1/06788
摘要： A test and measurement instrument includes a user interface, one or more probes to connect to a device under test (DUT), and one or more processors to take measurements during application of a double pulse test to the DUT to create measurement data, identify a measurement start point, find a measurement stop point, use the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and display the output charge to a user. A method of determining output charge of a device under test (DUT) includes taking measurements during application of a double pulse test to create measurement data, identifying a measurement start point, finding a measurement stop point, using the measurement data between the measurement start point and the measurement stop point to determine an output charge, Qoss, of the DUT, and displaying the output charge.
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公开(公告)号：US11181581B2
公开(公告)日：2021-11-23
申请号：US14257845
申请日：2014-04-21
申请人： TEKTRONIX, INC.
摘要： The disclosed technology relates to a method and apparatus for graphically displaying a switching cycle of a switching device. A switching voltage and a switching current are acquired for a device under test via a voltage probe and a current probe, respectively, for a plurality of switching cycles of the device under test. The switching current versus the switching voltage is plotted on a current versus voltage plot as a curve for each of the switching cycles. Each of the curves on the current versus voltage plot overlap each other and are displayed to a user.
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公开(公告)号：US20160334833A1
公开(公告)日：2016-11-17
申请号：US14814137
申请日：2015-07-30
申请人： Tektronix, Inc.
IPC分类号： G06F1/10
CPC分类号： G06F1/10 , G01R31/31709 , G01R31/3171
摘要： A system for dynamically calibrating operational parameters of a Device Under Test (DUT) includes a signal generator for generating a data pattern, a DUT structured to generate a clock signal, an oscilloscope structured to measure margins of the generated clock signal compared to an eye-diagram produced on the oscilloscope from the data pattern, and a calibration unit. The calibration unit can produce a candidate a jitter value for the signal generator, receive a determination from the oscilloscope whether the data pattern generated with the candidate jitter value causes the DUT to produce the generated clock signal within a pre-determined tolerance level, and modify the jitter value accordingly. The calibration unit may also be further structured to generate voltage swing values.
摘要翻译： 用于动态校准被测设备（DUT）的操作参数的系统包括用于产生数据模式的信号发生器，被构造成产生时钟信号的DUT，被构造为测量所生成的时钟信号的边缘的示波器， 在示波器上从数据模式生成的图和校准单元。 校准单元可以产生候选信号发生器的抖动值，接收来自示波器的确定，用候选抖动值产生的数据模式是否使DUT在预定的公差电平内产生产生的时钟信号，并修改 抖动值相应。 校准单元还可以进一步构造成产生电压摆幅值。
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公开(公告)号：US12020855B2
公开(公告)日：2024-06-25
申请号：US17315022
申请日：2021-05-07
申请人： Tektronix, Inc.
CPC分类号： H01F27/346 , G01R33/14 , H01F3/10 , H01F27/24 , H01F27/42 , H01F2003/106 , H01F2027/348
摘要： A test and measurement instrument for determining magnetic core losses of a device under test during in circuit operation. The test and measurement instrument receives a primary current signal from a primary winding of a device under test and receives a primary voltage signal measured across a magnetic core of the device under test. Based on the primary electric current signal and the primary voltage signal, the test and measurement instrument determines a magnetic loss of the device under test. In some examples, the test and measurement instrument can use primary and secondary voltage and current inputs to determine the magnetic loss of the device under test. The magnetic loss of the device under test can be displayed on a display of the test and measurement instrument. The magnetic loss can include a total magnetic loss, a hysteresis loss, a copper loss, and/or other losses.
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公开(公告)号：US20230251699A1
公开(公告)日：2023-08-10
申请号：US18105736
申请日：2023-02-03
申请人： Tektronix, Inc.
发明人： Madhusudan Acharya , Yogesh M. Pai , Krishna N H Sri , Anthony B. Ambrose , Blair Battye , Dallas J. Mohler
摘要： A test and measurement instrument includes components and methods for measuring noise at an output of a power supply, measuring jitter of a serial data signal produced by a data generating circuit coupled to the power supply and correlating the noise measured from the power supply to the jitter of the serial data signal. The correlation may be performed in the frequency domain. Spectral plots of the measured noise and the measured jitter may be generated and presented to the user.
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公开(公告)号：US11275131B1
公开(公告)日：2022-03-15
申请号：US16599067
申请日：2019-10-10
申请人： Tektronix, Inc.
摘要： A test and measurement instrument, including at least one port configured to receive a signal from a device under test (DUT), the signal including a current signal acquired across a magnetic core of the DUT and a voltage signal acquired across the magnetic core of the DUT, and one or more processors. The one or more processors are configured to determine a hysteresis loop based on the current signal and the voltage signal, determine a magnetic flux of the magnetic core based on the voltage signal and the current signal for a number of sample points for each cycle, and determine a maximum magnetic flux for all cycles and a hysteresis loop cycle that corresponds to the maximum magnetic flux. A display configured to display at least one of the hysteresis loop, the signal received from the DUT, and the hysteresis loop cycle that corresponds to the maximum magnetic flux.
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