公开(公告)号：US20230236943A1

公开(公告)日：2023-07-27

申请号：US18100180

申请日：2023-01-23

Applicant: Tektronix, Inc.

Inventor： K T Anurag ,  Nitin Khaneja ,  Akshay Mishra ,  K Vani

IPC: G06F11/27 ,  G06F9/54

CPC classification number: G06F11/27 ,  G06F9/547

Abstract: A test and measurement system includes an instrument having an input port structured to receive an input signal from a Device Under Test (DUT), a memory structured to store data derived from the input signal, a remote access manager, and an instrument state manager structured to maintain a present operating state of the instrument. The system further includes a remote device structured to receive through a communication network at least a portion of the stored data derived from the input signal from the instrument, and further structured to receive a transaction identifier that identifies the present operating state of the instrument when the portion of the stored data was acquired by the instrument. Methods are also described.

公开(公告)号：US12235746B2

公开(公告)日：2025-02-25

申请号：US18100180

申请日：2023-01-23

Applicant: Tektronix, Inc.

Inventor： K T Anurag ,  Nitin Khaneja ,  Akshay Mishra ,  K Vani

IPC: G06F11/00 ,  G06F9/54 ,  G06F11/27

Abstract: A test and measurement system includes an instrument having an input port structured to receive an input signal from a Device Under Test (DUT), a memory structured to store data derived from the input signal, a remote access manager, and an instrument state manager structured to maintain a present operating state of the instrument. The system further includes a remote device structured to receive through a communication network at least a portion of the stored data derived from the input signal from the instrument, and further structured to receive a transaction identifier that identifies the present operating state of the instrument when the portion of the stored data was acquired by the instrument. Methods are also described.