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公开(公告)号:US20230236943A1
公开(公告)日:2023-07-27
申请号:US18100180
申请日:2023-01-23
Applicant: Tektronix, Inc.
Inventor: K T Anurag , Nitin Khaneja , Akshay Mishra , K Vani
Abstract: A test and measurement system includes an instrument having an input port structured to receive an input signal from a Device Under Test (DUT), a memory structured to store data derived from the input signal, a remote access manager, and an instrument state manager structured to maintain a present operating state of the instrument. The system further includes a remote device structured to receive through a communication network at least a portion of the stored data derived from the input signal from the instrument, and further structured to receive a transaction identifier that identifies the present operating state of the instrument when the portion of the stored data was acquired by the instrument. Methods are also described.
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公开(公告)号:US12235746B2
公开(公告)日:2025-02-25
申请号:US18100180
申请日:2023-01-23
Applicant: Tektronix, Inc.
Inventor: K T Anurag , Nitin Khaneja , Akshay Mishra , K Vani
Abstract: A test and measurement system includes an instrument having an input port structured to receive an input signal from a Device Under Test (DUT), a memory structured to store data derived from the input signal, a remote access manager, and an instrument state manager structured to maintain a present operating state of the instrument. The system further includes a remote device structured to receive through a communication network at least a portion of the stored data derived from the input signal from the instrument, and further structured to receive a transaction identifier that identifies the present operating state of the instrument when the portion of the stored data was acquired by the instrument. Methods are also described.
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公开(公告)号:US20240142530A1
公开(公告)日:2024-05-02
申请号:US18385318
申请日:2023-10-30
Applicant: Tektronix, Inc.
Inventor: K T Anurag , Krishna N H Sri , Madhusudan Acharya , P E Ramesh
IPC: G01R31/389 , G01R31/367 , G01R31/3842
CPC classification number: G01R31/389 , G01R31/367 , G01R31/3842
Abstract: A testing system for performing Electrochemical Impedance Spectroscopy on a Unit Under Test (UUT) includes a function generator configured to apply a plurality of frequency components combined in a single burst or broadband stimulus to the UUT, and an oscilloscope having one or more processors configured to measure an amplitude ratio and phase difference between a voltage and a current of the UUT at a plurality of frequencies after the single burst or broadband stimulus of frequency components has been applied, generate a Nyquist plot of impendence values in both real and imaginary axes from the measured phase difference, and present the Nyquist plot at an output of the oscilloscope. Methods of operation are also described.
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公开(公告)号:US20220329332A1
公开(公告)日:2022-10-13
申请号:US17714842
申请日:2022-04-06
Applicant: Tektronix, Inc.
Inventor: K T Anurag , Darshan Mehta , P E Ramesh
IPC: H04B17/40 , H04B17/318 , H04B17/18 , H04B17/29
Abstract: A test monitor extracts waveforms from a differential transmission line of an automobile network without disrupting the differential transmission line, and stores the data decoded from the extracted waveforms. The test monitor includes a first input configured to receive a voltage waveform from a voltage probe electrically coupled to the differential transmission line that electrically connects a first ECU device and a second device, a second input configured to receive a current waveform from a current probe electrically coupled to the differential transmission line, and one or more processors configured to receive the voltage waveform and the current waveform and determine a voltage of the first ECU device and a voltage of the second device based on the voltage waveform and the current waveform. The test monitor may be embodied in an FPGA. The test monitor enables monitoring of message transfers across a network in a non-intrusive and non-invasive manner, without the necessity of using a repeater or switch.
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