公开(公告)号：US20240255572A1

公开(公告)日：2024-08-01

申请号：US18407266

申请日：2024-01-08

Applicant: Tektronix, Inc.

Inventor： Muhammad Saad Chughtai ,  Mark L. Guenther ,  Pavel R. Zivny

IPC: G01R31/317 ,  G01R13/02 ,  G01R29/26

CPC classification number: G01R31/31709 ,  G01R13/02 ,  G01R29/26

Abstract: A test and measurement instrument includes one or more ports to allow the instrument to connect to a DUT, a memory, a user interface including a display to display waveform signals received from the DUT and controls to allow a user to select settings for the instrument, and one or more processors configured to execute code that causes the one or more processors to: receive a signal from the DUT having multiple signal levels and multiple jitter thresholds; and adjust each measurement of the signal from the DUT using a jitter compensation value for each jitter threshold to produce a final measurement. A method includes receiving a waveform signal having multiple signal levels and multiple jitter thresholds from a device under test (DUT), and adjusting measurements of each level of the signal using a jitter compensation value for each level to produce final measurements.