公开(公告)号：US20230098379A1

公开(公告)日：2023-03-30

申请号：US17951064

申请日：2022-09-22

申请人： Tektronix, Inc.

发明人： Mark Anderson Smith ,  Sunil Mahawar ,  John J. Pickerd ,  Sriram K. Mandyam

IPC分类号： G06N20/00 ,  G06K9/62 ,  G06N3/02

摘要： A test and measurement machine learning model development system includes a user interface, one or more ports to allow the system to connect to one or more data sources, one or more memories, and one or more processors configured to execute code to cause the one or more processors to: display on the user interface one or more application user interfaces, the application user interfaces to allow a user to provide user inputs; use and application programming interface to configure the system based on the user inputs; receive data from the one or more data sources; apply one or more modules from a library of signal processing and feature extraction modules to the data to produce training data; apply one or more machine learning models to the training data; provide monitoring of the one or more machine learning models; and save the one or more machine learning models to at least one of the one or more memories. A method for operating a machine learning model development system includes displaying, on a user interface, one or more application user interfaces, the application user interfaces allowing a user to provide user inputs, configuring the system based on the user inputs through an application programming interface, receiving data from one or more data sources, applying one or more modules from a library of signal processing and feature extraction modules to the data to produce training data, applying one or more machine learning models to the training data, providing monitoring of the one or more machine learning models, and saving the one or more machine learning models to at least one of the one or more memories.

公开(公告)号：US20240184637A1

公开(公告)日：2024-06-06

申请号：US18523556

申请日：2023-11-29

申请人： Tektronix, Inc.

发明人： John J. Pickerd ,  Sam J. Strickling ,  Mark Anderson Smith ,  Sunil Mahawar

IPC分类号： G06F9/50 ,  G06F11/36

CPC分类号： G06F9/5077 ,  G06F11/362

摘要： A machine learning management system includes a repository having one or more partitions, the one or more partitions being separate from others of the partitions, a communications interface, and one or more processors configured to execute code to: receive a selected model and associated training data for the selected model through the communications interface from a customer; store the selected model and the associated training data in a partition dedicated to the customer; and manage the one or more partitions to ensure that the customer can only access the customer's partition. A method includes receiving a selected model and associated training data for the selected model from a customer, storing the selected model and the associated training data in a partition dedicated to the customer in a repository, and managing the one or more partitions to ensure that the customer can only access the partition dedicated to the customer.

公开(公告)号：US20240126221A1

公开(公告)日：2024-04-18

申请号：US18482765

申请日：2023-10-06

申请人： Tektronix, Inc.

发明人： John J. Pickerd ,  Mark Anderson Smith ,  Sunil Mahawar

IPC分类号： G05B13/02

CPC分类号： G05B13/027

摘要： A manufacturing system has a machine learning (ML) system having one or more neural networks and a configuration file associated with a trained neural network (NN), a structured data store having interfaces to the ML system a test automation application, a training store, a reference parameter store, a communications store, a trained model store, and one or more processors to control the data store to receive and store training data, allow the ML system to access the training data to train the one or more NNs, receive and store reference parameters and to access the reference parameters, receive and store prediction requests for optimal tuning parameters and associated data within the communication store, to provide requests to the ML system, allow the ML system to store trained NNs in the trained models store, and to recall a selected trained NN and provide the prediction to the test automation application.

公开(公告)号：US11442102B2

公开(公告)日：2022-09-13

申请号：US16870990

申请日：2020-05-10

申请人： Tektronix, Inc.

发明人： Sriram Mandyam Krishnakumar ,  Sunil Mahawar ,  Mahesha Guttahalli Lakshmipathy ,  Satish Kumar Makanahalli Ramaiah

IPC分类号： G01R31/317

摘要： A test and measurement system for parallel waveform analysis acquires waveforms resulting from performing tests on a device under test (DUT) and performs, at least partially in parallel, respective analyses of the waveforms resulting from performing tests on the DUT. The system also acquires a first waveform resulting from performing a first test with an oscilloscope on a DUT and performs analysis of the first waveform at least partially in parallel with acquiring a second waveform. Additionally, the system tracks a plurality of testing assets using inventory information of a plurality of testing equipment on the network and enables remote users to access equipment logs and results of the respective analyses of the waveforms stored on a cloud computing system for performance of analytics.