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    Test and measurement system for parallel waveform analysis
    1.
    发明授权
    Test and measurement system for parallel waveform analysis 有权

    公开(公告)号：US11442102B2

    公开(公告)日：2022-09-13

    申请号：US16870990

    申请日：2020-05-10

    申请人： Tektronix, Inc.

    发明人： Sriram Mandyam Krishnakumar ,  Sunil Mahawar ,  Mahesha Guttahalli Lakshmipathy ,  Satish Kumar Makanahalli Ramaiah

    IPC分类号： G01R31/317

    摘要： A test and measurement system for parallel waveform analysis acquires waveforms resulting from performing tests on a device under test (DUT) and performs, at least partially in parallel, respective analyses of the waveforms resulting from performing tests on the DUT. The system also acquires a first waveform resulting from performing a first test with an oscilloscope on a DUT and performs analysis of the first waveform at least partially in parallel with acquiring a second waveform. Additionally, the system tracks a plurality of testing assets using inventory information of a plurality of testing equipment on the network and enables remote users to access equipment logs and results of the respective analyses of the waveforms stored on a cloud computing system for performance of analytics.

    TECHNIQUE TO ANALYZE AND REPORT ACCURATE DATA, SYNCHRONIZING MULTIPLE SIGNALS IN A MEMORY CHIP
    3.
    发明公开
    TECHNIQUE TO ANALYZE AND REPORT ACCURATE DATA, SYNCHRONIZING MULTIPLE SIGNALS IN A MEMORY CHIP 审中-公开

    公开(公告)号：US20240274222A1

    公开(公告)日：2024-08-15

    申请号：US18534495

    申请日：2023-12-08

    申请人： Tektronix, Inc.

    发明人： Swapnil Jhawar ,  Chandra Sekhar Kappagantu ,  Mahesha Guttahalli Lakshmipathy ,  Sriram Mandyam Krishnakumar

    IPC分类号： G11C29/56

    CPC分类号： G11C29/56004 ,  G11C29/56008 ,  G11C29/56016

    摘要： A test and measurement system includes a multi-stack test subsystem including a plurality of test and measurement instruments, each instrument coupled to a device under test (DUT) to receive a plurality of test signals from the DUT during a test mode of operation. One test and measurement instrument is designated as a master and the remainder are designated as extension test and measurement instruments. The master communicates control signals to each of the extensions to synchronize the test and measurement instruments to simultaneously acquire the plurality of test signals provided by the DUT. An automation engine is coupled to the multi-stack test subsystem to receive the acquired plurality of test signals from the master, and the automation engine analyzes the acquired test signals to perform validation testing for each of plurality of test signals and simultaneously display results of the validation testing for the plurality of test signals.

    SYSTEM AND METHOD FOR DETECTION OF ANOMALIES IN TEST AND MEASUREMENT RESULTS OF A DEVICE UNDER TEST (DUT)
    4.
    发明申请
    SYSTEM AND METHOD FOR DETECTION OF ANOMALIES IN TEST AND MEASUREMENT RESULTS OF A DEVICE UNDER TEST (DUT) 有权

    公开(公告)号：US20230086626A1

    公开(公告)日：2023-03-23

    申请号：US17949158

    申请日：2022-09-20

    申请人： Tektronix, Inc.

    发明人： Siby Charley Pulikottil ,  Sriram Mandyam Krishnakumar ,  Mahesha Guttahalli Lakshmipathy

    IPC分类号： G01R31/28

    摘要： A test and measurement device has an interface, one or more connectors, each connector to allow the test and measurement device to connect to a test and measurement instrument, and one or more processors, the one or more processors configured to execute code to cause the one or more processors to: receive one or more user inputs through the interface identifying one or more tests to perform on a device under test (DUT); form a connection through one of the one or more connectors to the DUT to perform the one or more tests and receive test result data; apply one or more machine learning models to the test result data to identify potentially anomalous test results; and generate and present a representation of the test result data and the potentially anomalous test results. A method of analyzing test data includes receiving one or more user inputs through an interface identifying one or more test to perform on a device under test (DUT), forming a connection to at least one test and measurement instrument, directing the test and measurement instrument to perform one or more tests on the DUT and receive test result data, applying one or more machine learning models to the test result data to identify potentially anomalous test results, and generating and presenting a representation of the test result data and the potentially anomalous test results.