公开(公告)号：US09772391B2

公开(公告)日：2017-09-26

申请号：US14164016

申请日：2014-01-24

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  William A. Hagerup ,  William Q. Law

IPC: G01R27/26 ,  G01R35/00 ,  G01R1/067 ,  G01R13/02

CPC classification number: G01R35/00 ,  G01R1/067 ,  G01R13/029 ,  G01R35/005

Abstract: A test and measurement system including a test and measurement instrument, a probe connected to the test and measurement instrument, a device under test connected to the probe, at least one memory configured to store parameters for characterizing the probe, a user interface and a processor. The user interface is configured to receive a nominal source impedance of the device under test. The processor is configured to receive the parameters for characterizing the probe from the memory and the nominal source impedance of the device under test from the user interface and to calculate an equalization filter using the parameters for characterizing the probe and nominal source impedance from the user interface.

公开(公告)号：US20150212185A1

公开(公告)日：2015-07-30

申请号：US14164016

申请日：2014-01-24

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  William A. Hagerup ,  William Q. Law

IPC: G01R35/00 ,  G01R1/067

CPC classification number: G01R35/00 ,  G01R1/067 ,  G01R13/029 ,  G01R35/005

Abstract: A test and measurement system including a test and measurement instrument, a probe connected to the test and measurement instrument, a device under test connected to the probe, at least one memory configured to store parameters for characterizing the probe, a user interface and a processor. The user interface is configured to receive a nominal source impedance of the device under test. The processor is configured to receive the parameters for characterizing the probe from the memory and the nominal source impedance of the device under test from the user interface and to calculate an equalization filter using the parameters for characterizing the probe and nominal source impedance from the user interface.

Abstract translation: 一种测试和测量系统，包括测试和测量仪器，连接到测试和测量仪器的探头，连接到探头的被测器件，至少一个存储器，被配置为存储用于表征探针的参数，用户界面和处理器 。 用户接口被配置为接收被测设备的标称源阻抗。 处理器被配置为从用户接口接收用于表征探针的参数和被测器件的标称源阻抗，并且使用用于表征探头的参数和来自用户界面的标称源阻抗来计算均衡滤波器 。