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公开(公告)号：US11454651B2
公开(公告)日：2022-09-27
申请号：US17114468
申请日：2020-12-07
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
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公开(公告)号：US20180313870A1
公开(公告)日：2018-11-01
申请号：US16028236
申请日：2018-07-05
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
CPC classification number: G01R1/06788 , G01R1/06766 , G01R1/06794 , G01R31/024 , G01R31/026
Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
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公开(公告)号：US20180059139A1
公开(公告)日：2018-03-01
申请号：US15806270
申请日：2017-11-07
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , William A. Hagerup , Ira G. Pollock , Christina D. Enns , James E. Spinar , Kathleen F.M. Ullom , Charles M. Hartmann , Daniel J. Ayres
IPC: G01R1/067
CPC classification number: G01R1/06722 , C12Q1/00 , G01R1/06733 , G01R1/06766 , G01R1/06772 , G01R1/06788 , G01R1/073 , G05G1/00 , H01L21/00 , H01L2221/00 , H01R13/2421 , H01R2101/00 , H01R2201/20
Abstract: A test probe tip can include a resistive element coupled with a tip component. The resistive element can include a resistive layer disposed on an exterior surface of a structural member of the resistive impedance element. In embodiments, the resistive element can be configured to form a structural component of the test probe tip without an insulating covering applied thereto. Additional embodiments may be described and/or claimed herein.
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公开(公告)号：US09772391B2
公开(公告)日：2017-09-26
申请号：US14164016
申请日：2014-01-24
Applicant: Tektronix, Inc.
Inventor： John J. Pickerd , William A. Hagerup , William Q. Law
CPC classification number: G01R35/00 , G01R1/067 , G01R13/029 , G01R35/005
Abstract: A test and measurement system including a test and measurement instrument, a probe connected to the test and measurement instrument, a device under test connected to the probe, at least one memory configured to store parameters for characterizing the probe, a user interface and a processor. The user interface is configured to receive a nominal source impedance of the device under test. The processor is configured to receive the parameters for characterizing the probe from the memory and the nominal source impedance of the device under test from the user interface and to calculate an equalization filter using the parameters for characterizing the probe and nominal source impedance from the user interface.
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公开(公告)号：US09194888B2
公开(公告)日：2015-11-24
申请号：US13649303
申请日：2012-10-11
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
CPC classification number: G01R1/06788 , G01R1/06766 , G01R1/06794 , G01R31/024 , G01R31/026
Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
Abstract translation: 测试系统可以包括适于耦合在测试测量设备和被测设备（DUT）之间的探头。 探头可以包括用于从DUT接收有效信号的信号输入和用于向测试测量装置提供有源信号的信号输出。 探头还可以包括一个连接到DUT地的输入接地和一个连接到测试测量设备地的输出地。 探头接地连接检查装置可以自动确定探头接地与DUT接地和测试测量设备接地是否牢固。
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Patent Agency Ranking
公开(公告)号：US20150212185A1
公开(公告)日：2015-07-30
申请号：US14164016
申请日：2014-01-24
Applicant: Tektronix, Inc.
Inventor： John J. Pickerd , William A. Hagerup , William Q. Law
CPC classification number: G01R35/00 , G01R1/067 , G01R13/029 , G01R35/005
Abstract: A test and measurement system including a test and measurement instrument, a probe connected to the test and measurement instrument, a device under test connected to the probe, at least one memory configured to store parameters for characterizing the probe, a user interface and a processor. The user interface is configured to receive a nominal source impedance of the device under test. The processor is configured to receive the parameters for characterizing the probe from the memory and the nominal source impedance of the device under test from the user interface and to calculate an equalization filter using the parameters for characterizing the probe and nominal source impedance from the user interface.
Abstract translation: 一种测试和测量系统，包括测试和测量仪器，连接到测试和测量仪器的探头，连接到探头的被测器件，至少一个存储器，被配置为存储用于表征探针的参数，用户界面和处理器 。 用户接口被配置为接收被测设备的标称源阻抗。 处理器被配置为从用户接口接收用于表征探针的参数和被测器件的标称源阻抗，并且使用用于表征探头的参数和来自用户界面的标称源阻抗来计算均衡滤波器 。
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公开(公告)号：US11249111B2
公开(公告)日：2022-02-15
申请号：US16028236
申请日：2018-07-05
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
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公开(公告)号：US20210088553A1
公开(公告)日：2021-03-25
申请号：US17114468
申请日：2020-12-07
Applicant: Tektronix, Inc.
Inventor： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
Abstract: A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
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公开(公告)号：US10168356B2
公开(公告)日：2019-01-01
申请号：US14830339
申请日：2015-08-19
Applicant: Tektronix, Inc.
Inventor： Julie A. Campbell , William A. Hagerup , Ira G. Pollock
IPC: G01R1/067
Abstract: A probe for making electrical contact with a device-under-test test point includes a body, a rigid member capable of travelling linearly with respect to the body, a flexible arm having a test point contact at one end and fastened to the rigid member at the other end, and a flexible linkage fixed to the body and to the flexible arm. The flexible linkage is structured to cause the flexible arm to bend in response to travel of the rigid member in one direction, and to cause the flexible arm to unbend in response to travel of the rigid member in the other direction. A second flexible arm may be included, the two arms opening and closing to change the distance between test point contacts. A light source may be disposed on a portion of the flexible linkage that simultaneously articulates to automatically track the orientation of the test point contact.
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公开(公告)号：US10119992B2
公开(公告)日：2018-11-06
申请号：US14676703
申请日：2015-04-01
Applicant: Tektronix, Inc.
Inventor： William A. Hagerup , Julie A. Campbell , Ira G. Pollock , James E. Spinar , Kathleen F. M. Ullom , Charles M. Hartmann , Daniel J. Ayres , Christina D. Enns
IPC: G01R1/067
Abstract: A test probe tip can include a compliance member or force deflecting assembly and a tip component. The compliance member or force deflecting assembly can include a plunger component and a barrel component to receive the plunger component, wherein the plunger component is configured to slide axially inside the barrel component. The test probe tip can also include a spring mechanism within the barrel component to act on the plunger component, and a resistive/impedance element coupled with the plunger component at one end and with the tip component at the opposite end, the resistive/impedance element including at least one rod having a semi-cylindrical form and a resistive material situated thereon.
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