Abstract:
A circuit comprises a first amplifier coupled to a first and a second node; a differential capacitive load coupled to the first and the second node, the differential capacitive load coupled between drains of transistors in a cross coupled transistor circuit; a current mirror coupled to a source of each transistor; and a capacitor coupled between the sources of the transistors. A plurality of amplifiers can be coupled to the differential capacitive load, wherein each amplifier comprises a clock-less pre-amplifier of a comparator. The amplifiers may be abutted to one another such that an active transistor of a first differential stage in a first amplifier behaves as a dummy transistor for an adjacent differential stage in a second amplifier.
Abstract:
The differential output of a Programmable Gain Amplifier (PGA) is loaded by the input differential gate capacitance of a plurality of Analog to Digital convertors (ADC) comparators and the differential metal layer traces to interconnect these comparators to the PGA. The differential capacitive load presented to the PGA is quite large and reduces the bandwidth of this interconnect between the PGA and ADC. To overcome the performance degradation due to the differential capacitive load, an active negative-capacitor circuit cancels the effect of the large input capacitance of the ADC comparators. This cancelation extends the gain characteristics of the interconnect between the PGA's output and the inputs of the first stage of the comparators. The active negative-capacitance is comprised of a cross pair NMOS with a capacitor connecting their sources where each NMOS is biased by a current source.
Abstract:
A circuit comprises a first amplifier coupled to a first and a second node; a differential capacitive load coupled to the first and the second node, the differential capacitive load coupled between drains of transistors in a cross coupled transistor circuit; a current mirror coupled to a source of each transistor; and a capacitor coupled between the sources of the transistors. A plurality of amplifiers can be coupled to the differential capacitive load, wherein each amplifier comprises a clock-less pre-amplifier of a comparator. The amplifiers may be abutted to one another such that an active transistor of a first differential stage in a first amplifier behaves as a dummy transistor for an adjacent differential stage in a second amplifier
Abstract:
A negative-capacitance circuit comprises a first node coupled to a drain of a first transistor and a gate of a second transistor; a second node coupled to a drain of the second transistor and a gate of the first transistor; a capacitor coupled between a source of the first transistor and a source of the second transistor; a first current mirror coupled between a supply voltage and the source of the first transistor; and a second current mirror coupled between the supply voltage and the source of the second transistor. The circuit can be configured to drive the differential capacitive load between the first and second nodes in a shorter time period, thereby increasing the transfer bandwidth of the differential signal.
Abstract:
A circuit comprises a first amplifier coupled to a first and a second node; a differential capacitive load coupled to the first and the second node, the differential capacitive load coupled between drains of transistors in a cross coupled transistor circuit; a current mirror coupled to a source of each transistor; and a capacitor coupled between the sources of the transistors. A plurality of amplifiers can be coupled to the differential capacitive load, wherein each amplifier comprises a clock-less pre-amplifier of a comparator. The amplifiers may be abutted to one another such that an active transistor of a first differential stage in a first amplifier behaves as a dummy transistor for an adjacent differential stage in a second amplifier.
Abstract:
A circuit comprises a first amplifier coupled to a first and a second node; a differential capacitive load coupled to the first and the second node, the differential capacitive load coupled between drains of transistors in a cross coupled transistor circuit; a current mirror coupled to a source of each transistor; and a capacitor coupled between the sources of the transistors. A plurality of amplifiers can be coupled to the differential capacitive load, wherein each amplifier comprises a clock-less pre-amplifier of a comparator. The amplifiers may be abutted to one another such that an active transistor of a first differential stage in a first amplifier behaves as a dummy transistor for an adjacent differential stage in a second amplifier
Abstract:
A circuit comprises a first amplifier coupled to a first and a second node; a differential capacitive load coupled to the first and the second node, the differential capacitive load coupled between drains of transistors in a cross coupled transistor circuit; a current mirror coupled to a source of each transistor; and a capacitor coupled between the sources of the transistors. A plurality of amplifiers can be coupled to the differential capacitive load, wherein each amplifier comprises a clock-less pre-amplifier of a comparator. The amplifiers may be abutted to one another such that an active transistor of a first differential stage in a first amplifier behaves as a dummy transistor for an adjacent differential stage in a second amplifier
Abstract:
The differential output of a Programmable Gain Amplifier (PGA) is loaded by the input differential gate capacitance of a plurality of Analog to Digital convertors (ADC) comparators and the differential metal layer traces to interconnect these comparators to the PGA. The differential capacitive load presented to the PGA is quite large and reduces the bandwidth of this interconnect between the PGA and ADC. To overcome the performance degradation due to the differential capacitive load, an active negative-capacitor circuit cancels the effect of the large input capacitance of the ADC comparators. This cancelation extends the gain characteristics of the interconnect between the PGA's output and the inputs of the first stage of the comparators. The active negative-capacitance is comprised of a cross pair NMOS with a capacitor connecting their sources where each NMOS is biased by a current source.
Abstract:
A negative-capacitance circuit comprises a first node coupled to a drain of a first transistor and a gate of a second transistor; a second node coupled to a drain of the second transistor and a gate of the first transistor; a capacitor coupled between a source of the first transistor and a source of the second transistor; a first current mirror coupled between a supply voltage and the source of the first transistor; and a second current mirror coupled between the supply voltage and the source of the second transistor. The circuit can be configured to drive the differential capacitive load between the first and second nodes in a shorter time period, thereby increasing the transfer bandwidth of the differential signal.