公开(公告)号：US11921154B2

公开(公告)日：2024-03-05

申请号：US17745054

申请日：2022-05-16

申请人： TeraView Limited

发明人： Bryan Edward Cole ,  Darius Sullivan ,  Simon Chandler

IPC分类号： G01R1/067 ,  G01R31/28 ,  G01R31/308 ,  G01R35/00

CPC分类号： G01R31/2887 ,  G01R31/308 ,  G01R35/005

摘要： A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.

公开(公告)号：US20240192270A1

公开(公告)日：2024-06-13

申请号：US18585589

申请日：2024-02-23

申请人： TeraView Limited

发明人： Brian Edward Cole ,  Darius Sullivan ,  Simon Chandler

IPC分类号： G01R31/28 ,  G01R31/308 ,  G01R35/00

CPC分类号： G01R31/2887 ,  G01R31/308 ,  G01R35/005

摘要： A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.

公开(公告)号：US11366158B2

公开(公告)日：2022-06-21

申请号：US16061375

申请日：2016-12-16

申请人： TeraView Limited

发明人： Bryan Edward Cole ,  Darius Sullivan ,  Simon Chandler

IPC分类号： G01R31/28 ,  G01R1/073 ,  G01R31/00 ,  G01R31/308 ,  G01R35/00

摘要： A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.

公开(公告)号：US20220268833A1

公开(公告)日：2022-08-25

申请号：US17745054

申请日：2022-05-16

申请人： TeraView Limited

发明人： Bryan Edward Cole ,  Darius Sullivan ,  Simon Chandler

IPC分类号： G01R31/28 ,  G01R31/308 ,  G01R35/00

摘要： A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.

公开(公告)号：US20180364301A1

公开(公告)日：2018-12-20

申请号：US16061375

申请日：2016-12-16

申请人： TeraView Limited

发明人： Bryan Edward Cole ,  Darius Sullivan ,  Simon Chandler

IPC分类号： G01R31/28 ,  G01R31/308 ,  G01R35/00

摘要： A test system for testing a device having a plurality of electrical contacts. The test system comprising: a device table operable to hold at least one device under test, a probe comprising at least one probe end for contacting electrical contacts of a device under test, a movement mechanism operable to move one or both of the device table and the probe so as to bring the at least one probe end into contact with at least one electrical contact of a device under test, and a profile determining system configured to determine a profile of the electrical contacts of a device under test.