公开(公告)号：US20080104449A1

公开(公告)日：2008-05-01

申请号：US11591080

申请日：2006-10-31

申请人： Terry Farren ,  Heng Gong ,  Yong Shen ,  Jing Zhang

发明人： Terry Farren ,  Heng Gong ,  Yong Shen ,  Jing Zhang

IPC分类号： G06F11/36

CPC分类号： G06F11/26

摘要： One embodiment in accordance with the invention is a method that comprises testing a first number of physical devices using a first test sequence that comprises an item. A second number of physical devices are tested using a second test sequence. It is noted that the second test sequence comprises the item of the first test and a second item.

摘要翻译： 根据本发明的一个实施例是一种方法，其包括使用包括项目的第一测试序列来测试第一数量的物理设备。 使用第二测试序列测试第二数量的物理设备。 注意，第二测试序列包括第一测试项目和第二项目。

公开(公告)号：US08174779B2

公开(公告)日：2012-05-08

申请号：US11591080

申请日：2006-10-31

申请人： Terry Farren ,  Heng Gong ,  Yong Shen ,  Jing Zhang

发明人： Terry Farren ,  Heng Gong ,  Yong Shen ,  Jing Zhang

IPC分类号： G11B27/36

CPC分类号： G06F11/26

摘要： One embodiment in accordance with the invention is a method that comprises testing a first number of physical devices using a first test sequence that comprises an item. A second number of physical devices are tested using a second test sequence. It is noted that the second test sequence comprises the item of the first test and a second item.

摘要翻译： 根据本发明的一个实施例是一种方法，其包括使用包括项目的第一测试序列来测试第一数量的物理设备。 使用第二测试序列测试第二数量的物理设备。 注意，第二测试序列包括第一测试项目和第二项目。

公开(公告)号：US07288935B2

公开(公告)日：2007-10-30

申请号：US11107186

申请日：2005-04-15

申请人： Terry Farren ,  Yong Shen

发明人： Terry Farren ,  Yong Shen

IPC分类号： G01R33/00

CPC分类号： G11B5/455

摘要： A dynamic electrical tester (DET) for testing head gimbal assemblies (HGA) is disclosed. The DET simulates disk drive operation while significantly reducing tester capital investment. Multiple HGAs are tested simultaneously using modular spin stands with shared electronics. This design increases utilization of electronics and minimizes the effect of spindle start/stop time. A parallel array of spin stands with shared electronics is used to reduce tester component and materials cost by multiplexing between the spin stands. The DET has the significant advantage of reducing wait time by making use of the electronics while they are idle during mechanical-related delays. In addition, the DET includes more channels per test head that can readily switch back and forth between the products being tested.

摘要翻译： 公开了一种用于测试头万向架组件（HGA）的动态电气测试仪（DET）。 DET模拟磁盘驱动器操作，同时显着减少测试人员的投资。 使用具有共享电子设备的模块化旋转架同时测试多个HGA。 这种设计提高了电子元件的利用率，并最大限度地减少了主轴启动/停止时间的影响。 具有共享电子设备的并联阵列旋转架用于通过在旋转架之间进行复用来降低测试仪组件和材料成本。 DET具有通过在机械相关延迟期间空闲时利用电子设备来减少等待时间的显着优点。 此外，DET包括每个测试头更多的通道，可以在被测产品之间轻松切换。

公开(公告)号：US20060232271A1

公开(公告)日：2006-10-19

申请号：US11107186

申请日：2005-04-15

申请人： Terry Farren ,  Yong Shen

发明人： Terry Farren ,  Yong Shen

IPC分类号： G01R33/12

CPC分类号： G11B5/455

摘要： A dynamic electrical tester (DET) for testing head gimbal assemblies (HGA) is disclosed. The DET simulates disk drive operation while significantly reducing tester capital investment. Multiple HGAs are tested simultaneously using modular spin stands with shared electronics. This design increases utilization of electronics and minimizes the effect of spindle start/stop time. A parallel array of spin stands with shared electronics is used to reduce tester component and materials cost by multiplexing between the spin stands. The DET has the significant advantage of reducing wait time by making use of the electronics while they are idle during mechanical-related delays. In addition, the DET includes more channels per test head that can readily switch back and forth between the products being tested.

摘要翻译： 公开了一种用于测试头万向架组件（HGA）的动态电气测试仪（DET）。 DET模拟磁盘驱动器操作，同时显着减少测试人员的投资。 使用具有共享电子设备的模块化旋转架同时测试多个HGA。 这种设计提高了电子元件的利用率，并最大限度地减少了主轴启动/停止时间的影响。 具有共享电子设备的并联阵列旋转架用于通过在旋转架之间进行复用来降低测试仪组件和材料成本。 DET具有通过在机械相关延迟期间空闲时利用电子设备来减少等待时间的显着优点。 此外，DET包括每个测试头更多的通道，可以在被测产品之间轻松切换。

公开(公告)号：US20070217051A1

公开(公告)日：2007-09-20

申请号：US11376660

申请日：2006-03-14

申请人： Yong Shen ,  Jing Zhang

发明人： Yong Shen ,  Jing Zhang

IPC分类号： G11B21/02 ,  G11B27/36

CPC分类号： G11B5/60 ,  G11B5/3948 ,  G11B5/6029

摘要： A system and method for determining head-disk contact (HDC) in a disk drive uses the signal from the magnetoresistive (MR) read head and does not require the presence of magnetic transitions on the disk. The method thus has application in head-disk testers or “spin stands” to facilitate the design and testing of slider-suspension assemblies and fly-height actuators, as well as in disk drives to take corrective action before HDC and/or to control fly-height actuators. The invention is also a magnetic recording disk drive that has a fly-height actuator and a low-pass filter and comparator circuit for the MR signal. When the output of the filter exceeds a threshold the comparator circuit output indicates the onset of HDC. The comparator circuit output is input to a digital processor or controller. When the controller determines the onset of HDC or that HDC has occurred, it generates a control signal that can be used to cause the disk drive to take corrective action.

摘要翻译： 用于确定磁盘驱动器中的磁头盘接触（HDC）的系统和方法使用来自磁阻（MR）读取头的信号，并且不需要在磁盘上存在磁转变。 因此，该方法可用于头盘测试器或“旋转支架”，以便于滑块悬挂组件和飞高执行器的设计和测试，以及磁盘驱动器在HDC之前采取校正动作和/或控制飞行 高精度执行器。 本发明还是一种磁记录盘驱动器，其具有飞行高度致动器和用于MR信号的低通滤波器和比较器电路。 当滤波器的输出超过阈值时，比较器电路输出指示HDC的开始。 比较器电路输出被输入到数字处理器或控制器。 当控制器确定HDC的发生或HDC已经发生时，它产生可用于使磁盘驱动器采取校正动作的控制信号。

公开(公告)号：US07050934B1

公开(公告)日：2006-05-23

申请号：US10997173

申请日：2004-11-24

申请人： Yong Shen ,  Jing Zhang

发明人： Yong Shen ,  Jing Zhang

IPC分类号： G06F11/30

CPC分类号： G05B17/02 ,  G06Q10/06

摘要： Embodiments of the invention provide methods for enhancing the downstream product yield without significantly affecting the yield of components from which downstream products are made or enhancing yield of the components without significantly affecting the downstream product yield and performance. In one embodiment, a method comprises obtaining a failure rate of the downstream manufacturing process as a function of each of a plurality of component performance parameters of the current manufacturing process of the component; optimizing weighted factors based on correlation between the current manufacturing process of the component and the downstream product, the weight factors each corresponding to one of the plurality of component performance parameters; and calculating figure of merits (FOM) with respect to the plurality of component performance parameters of the current manufacturing process of the component, the FOM including the weighted factors.

摘要翻译： 本发明的实施方案提供了用于增强下游产物产率而不显着影响下游产物制备成分的产率或提高组分的产率而不显着影响下游产物产率和性能的方法。 在一个实施例中，一种方法包括根据组件的当前制造过程的多个部件性能参数中的每一个获得下游制造过程的故障率; 基于所述组件的当前制造过程与所述下游产品之间的相关性来优化加权因子，所述权重因子各自对应于所述多个组件性能参数之一; 以及针对所述部件的当前制造过程的所述多个部件性能参数计算所述优点（FOM），所述FOM包括所述加权因子。

公开(公告)号：US07529050B2

公开(公告)日：2009-05-05

申请号：US11708941

申请日：2007-02-20

申请人： Yong Shen ,  Mike X. Wang ,  Jing Zhang

发明人： Yong Shen ,  Mike X. Wang ,  Jing Zhang

IPC分类号： G11B5/455 ,  G11B27/36

CPC分类号： G11B5/455 ,  G11B5/4555

摘要： One embodiment in accordance with the invention is a method for measuring a track width for a magnetic recording head comprising writing a first track and a second track on a disk at two different positions. Note that the first track is written at a frequency plus a frequency shift value while the second track is written at the frequency minus the frequency shift value.

摘要翻译： 根据本发明的一个实施例是一种用于测量磁记录头的轨道宽度的方法，包括在两个不同位置在盘上写入第一轨道和第二轨道。 注意，第一磁道以频率加上频移值写入，而第二磁道被写入频率减去频移值。

公开(公告)号：US07292401B2

公开(公告)日：2007-11-06

申请号：US11376660

申请日：2006-03-14

申请人： Yong Shen ,  Jing Zhang

发明人： Yong Shen ,  Jing Zhang

IPC分类号： G11B15/18

CPC分类号： G11B5/60 ,  G11B5/3948 ,  G11B5/6029

摘要： A system and method for determining head-disk contact (HDC) in a disk drive uses the signal from the magnetoresistive (MR) read head and does not require the presence of magnetic transitions on the disk. The method thus has application in head-disk testers or “spin stands” to facilitate the design and testing of slider-suspension assemblies and fly-height actuators, as well as in disk drives to take corrective action before HDC and/or to control fly-height actuators. The invention is also a magnetic recording disk drive that has a fly-height actuator and a low-pass filter and comparator circuit for the MR signal. When the output of the filter exceeds a threshold the comparator circuit output indicates the onset of HDC. The comparator circuit output is input to a digital processor or controller. When the controller determines the onset of HDC or that HDC has occurred, it generates a control signal that can be used to cause the disk drive to take corrective action.

公开(公告)号：US20080094743A1

公开(公告)日：2008-04-24

申请号：US11708941

申请日：2007-02-20

申请人： Yong Shen ,  Mike X. Wang ,  Jing Zhang

发明人： Yong Shen ,  Mike X. Wang ,  Jing Zhang

IPC分类号： G11B5/02

CPC分类号： G11B5/455 ,  G11B5/4555

摘要： One embodiment in accordance with the invention is a method for measuring a track width for a magnetic recording head comprising writing a first track and a second track on a disk at two different positions. Note that the first track is written at a frequency plus a frequency shift value while the second track is written at the frequency minus the frequency shift value.

摘要翻译： 根据本发明的一个实施例是一种用于测量磁记录头的轨道宽度的方法，包括在两个不同位置在盘上写入第一轨道和第二轨道。 注意，第一磁道以频率加上频移值写入，而第二磁道被写入频率减去频移值。

公开(公告)号：US20060111869A1

公开(公告)日：2006-05-25

申请号：US10997173

申请日：2004-11-24

申请人： Yong Shen ,  Jing Zhang

发明人： Yong Shen ,  Jing Zhang

IPC分类号： G06F17/18 ,  G06F19/00

CPC分类号： G05B17/02 ,  G06Q10/06

摘要： Embodiments of the invention provide methods for enhancing the downstream product yield without significantly affecting the yield of components from which downstream products are made or enhancing yield of the components without significantly affecting the downstream product yield and performance. In one embodiment, a method comprises obtaining a failure rate of the downstream manufacturing process as a function of each of a plurality of component performance parameters of the current manufacturing process of the component; optimizing weighted factors based on correlation between the current manufacturing process of the component and the downstream product, the weight factors each corresponding to one of the plurality of component performance parameters; and calculating figure of merits (FOM) with respect to the plurality of component performance parameters of the current manufacturing process of the component, the FOM including the weighted factors.

摘要翻译： 本发明的实施方案提供了用于增强下游产物产率而不显着影响下游产物制备成分的产率或提高组分的产率而不显着影响下游产物产率和性能的方法。 在一个实施例中，一种方法包括根据组件的当前制造过程的多个部件性能参数中的每一个获得下游制造过程的故障率; 基于所述组件的当前制造过程与所述下游产品之间的相关性来优化加权因子，所述权重因子各自对应于所述多个组件性能参数之一; 以及针对所述部件的当前制造过程的所述多个部件性能参数计算所述优点（FOM），所述FOM包括所述加权因子。