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公开(公告)号：US06411677B1
公开(公告)日：2002-06-25
申请号：US09950261
申请日：2001-09-10
IPC分类号： G21K102
CPC分类号： A61B6/583 , A61B6/4021 , G01N23/046 , G01N2223/419 , G01N2223/612
摘要： The present invention is, in one embodiment, a method for determining tracking control parameters for positioning an x-ray beam of a computed tomography imaging system having a movable collimator positionable in steps and a detector array including a plurality of rows of detector elements. The method includes steps of obtaining detector samples at a series of collimator step positions while determining a position of a focal spot of the x-ray beam; determining a beam position for each detector element at each collimator step utilizing the determined focal spot positions, a nominal focal spot length, and geometric parameters of the x-ray beam, collimator, and detector array; and determining a calibration parameter utilizing information so obtained. For example, in determining a target beam position at which to maintain the x-ray beam, a detector element differential error is determined according to ratios of successive collimator step positions; and a target beam position is selected for an isocenter element in accordance with the determined element differential errors.
摘要翻译： 本发明在一个实施例中是一种用于确定跟踪控制参数的方法，所述跟踪控制参数用于定位具有可定位的可移动准直仪的计算机断层摄影成像系统的X射线束和包括多行检测器元件的检测器阵列。 该方法包括以下步骤：在确定X射线束的焦斑的位置的同时在一系列准直器步骤位置获得检测器样本; 使用所确定的焦点位置，标称焦点长度以及x射线束，准直仪和检测器阵列的几何参数来确定每个准直器步骤处的每个检测器元件的光束位置; 以及使用如此获得的信息来确定校准参数。 例如，在确定维持X射线束的目标光束位置时，根据连续的准直仪台阶位置的比例来确定检测器元件差分误差; 并且根据确定的元件微分误差为等角点元件选择目标光束位置。
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公开(公告)号：US06310938B1
公开(公告)日：2001-10-30
申请号：US09384937
申请日：1999-08-27
IPC分类号： G21K100
CPC分类号： A61B6/583 , A61B6/4021 , G01N23/046 , G01N2223/419 , G01N2223/612
摘要： The present invention is, in one embodiment, a method for determining tracking control parameters for positioning an x-ray beam of a computed tomography imaging system having a movable collimator positionable in steps and a detector array including a plurality of rows of detector elements. The method includes steps of obtaining detector samples at a series of collimator step positions while determining a position of a focal spot of the x-ray beam; determining a beam position for each detector element at each collimator step utilizing the determined focal spot positions, a nominal focal spot length, and geometric parameters of the x-ray beam, collimator, and detector array; and determining a calibration parameter utilizing information so obtained. For example, in determining a target beam position at which to maintain the x-ray beam, a detector element differential error is determined according to ratios of successive collimator step positions; and a target beam position is selected for an isocenter element in accordance with the determined element differential errors.
摘要翻译： 本发明在一个实施例中是一种用于确定跟踪控制参数的方法，所述跟踪控制参数用于定位具有可定位的可移动准直器的计算机断层摄影成像系统的X射线束和包括多行检测器元件的检测器阵列。 该方法包括以下步骤：在确定X射线束的焦斑的位置的同时在一系列准直器步骤位置获得检测器样本; 使用所确定的焦点位置，标称焦点长度以及x射线束，准直仪和检测器阵列的几何参数来确定每个准直器步骤处的每个检测器元件的光束位置; 以及使用如此获得的信息来确定校准参数。 例如，在确定维持X射线束的目标光束位置时，根据连续的准直仪台阶位置的比例来确定检测器元件差分误差; 并且根据确定的元件微分误差为等角点元件选择目标光束位置。
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公开(公告)号：US06198791B1
公开(公告)日：2001-03-06
申请号：US09140289
申请日：1998-08-25
申请人： Hui David He , Hui Hu , Robert F. Senzig , Gary R. Strong , Guy M. Besson , David M. Hoffman , George E. Seidenschnur , Armin H. Pfoh , Jonathan A. Murray , Thomas L. Toth , Willi W. Hampel
发明人： Hui David He , Hui Hu , Robert F. Senzig , Gary R. Strong , Guy M. Besson , David M. Hoffman , George E. Seidenschnur , Armin H. Pfoh , Jonathan A. Murray , Thomas L. Toth , Willi W. Hampel
IPC分类号： A61B600
CPC分类号： A61B6/032 , A61B6/027 , A61B6/4085
摘要： The present invention is, in one aspect, an imaging system having a detector that has multiple detector cells extending along a z-axis, the detector being configured to collect multiple slices of data; and a scalable data acquisition system configured to convert signals from the detector to digital form, the scalable data acquisition system having a plurality of converter boards each with a plurality of channels, the channels and detector cells having an interweaved coupling to reduce susceptibility to band artifact.
摘要翻译： 本发明在一个方面是一种具有检测器的成像系统，所述检测器具有沿z轴延伸的多个检测器单元，所述检测器被配置为收集多个数据片段; 以及可配置成将来自检测器的信号转换成数字形式的可伸缩数据采集系统，所述可伸缩数据采集系统具有多个转换器板，每个转换器板具有多个通道，所述通道和检测器单元具有交织耦合以减少对带状伪影的敏感性 。
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公开(公告)号：US5828719A
公开(公告)日：1998-10-27
申请号：US779961
申请日：1996-12-23
CPC分类号： H05G1/30 , A61B6/027 , Y10S378/901
摘要： The present invention, in one form, is a system which, in one embodiment, varies DAS gain to better accommodate different scanning parameters between different scans, even at the same slice thickness. Specifically, in one embodiment, the DAS gain is varied, or modulated, as a function of slice thickness, x-ray tube current and voltage levels, scan time, and average detector gain. The DAS gain is modulated using a gain factor Gain.sub.-- Fac which is determined in accordance with each of the above-mentioned scanning parameters. The gain factor Gain.sub.-- Fac is then used to determine an appropriate DAS gain for such parameters. Particularly, DAS gains are stored in a look-up table in the CT system computer, and the gain factor Gain.sub.-- Fac is used to select the appropriate DAS gain from the look-up table. The determined DAS gain is then utilized to correct data acquired during a scan.
摘要翻译： 本发明在一种形式中是在一个实施例中，即使在相同的切片厚度下也可以改变DAS增益以更好地适应不同扫描之间的不同扫描参数的系统。 具体地说，在一个实施例中，作为切片厚度，X射线管电流和电压电平，扫描时间和平均检测器增益的函数，DAS增益被改变或调制。 使用根据上述每个扫描参数确定的增益因子Gain-Fac来调制DAS增益。 然后，增益因子Gain-Fac用于确定此类参数的适当DAS增益。 特别地，DAS增益存储在CT系统计算机的查找表中，增益因子Gain-Fac用于从查找表中选择适当的DAS增益。 然后使用确定的DAS增益来校正在扫描期间获取的数据。
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5.发明授权Methods and apparatus for troubleshooting scaleable multislice imaging system 失效用于排除可扩展多层成像系统的方法和设备公开(公告)号：US06246743B1
公开(公告)日：2001-06-12
申请号：US09140290
申请日：1998-08-25
IPC分类号： G01N2300
摘要： The present invention, in one form, is an imaging system which, in one embodiment, alters the configuration of a detector array and a data acquisition system to determine degraded component performance and generate fault isolation information. More specifically, by altering the configuration to include different combinations of detector array cells, interconnections, and one or more data acquisition channels, fault isolation information is generated.
摘要翻译： 本发明以一种形式是一种成像系统，其在一个实施例中改变检测器阵列和数据采集系统的配置，以确定劣化的部件性能并产生故障隔离信息。 更具体地，通过改变配置以包括检测器阵列单元，互连和一个或多个数据采集通道的不同组合，产生故障隔离信息。
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