公开(公告)号：US07150199B2

公开(公告)日：2006-12-19

申请号：US10958545

申请日：2004-10-05

申请人： Thomas Patrick Kieffer ,  Robert Barry Watson ,  Sharon Lee Karcher Harris

发明人： Thomas Patrick Kieffer ,  Robert Barry Watson ,  Sharon Lee Karcher Harris

IPC分类号： G01F1/00

CPC分类号： G01L1/2287

摘要： An improved strain gage and an improved manufacturing method are disclosed. The strain gage includes a semi-rigid substrate having a thickness of 3 to 30 mils, a resistive strain sensitive foil bonded to the semi-rigid substrate for providing a resistance varying with strain associated with a surface to which the strain gage is attached, a first and a second terminal operatively connected to the resistive strain sensitive foil, and an anti-static layer. The improved strain gage allows for reduced labor content in manufacturing by allowing use of modern automated electronic component manufacturing equipment.

摘要翻译： 公开了改进的应变计和改进的制造方法。 应变计包括厚度为3至30密耳的半刚性基底，结合到半刚性基底的电阻应变敏感箔，用于提供与应变计附着的表面相关联的应变变化的电阻， 第一和第二端子，其可操作地连接到电阻性应变敏感箔片和抗静电层。 改进的应变片允许通过允许使用现代自动电子元件制造设备来减少制造中的劳动量。