Shape measuring apparatus and shape measuring method
    1.
    发明授权
    Shape measuring apparatus and shape measuring method 有权
    形状测量仪和形状测量方法

    公开(公告)号:US08334985B2

    公开(公告)日:2012-12-18

    申请号:US12901123

    申请日:2010-10-08

    IPC分类号: G01B11/24 G06K9/36

    摘要: A shape measuring apparatus that measures a three-dimensional shape of a measuring target has a lighting device that irradiates the measuring target placed on a stage with light, an imaging device that takes an image of the measuring target, a shape calculating device that calculates orientations of normals at a plurality of points on a surface of the measuring target from an image, the image being obtained by performing imaging with the imaging device while the lighting device irradiates the measuring target with the light, the shape calculating device calculating the three-dimensional shape of the surface of the measuring target from the calculation result of the orientations of the normals, a ranging device that measures a distance from a predetermined reference position with respect to at least one point on the surface of the measuring target, and a determination device that determines a spatial position of the three-dimensional shape of the surface of the measuring target, the three-dimensional shape being obtained by the shape calculating device using information on the distance obtained by the ranging device.

    摘要翻译: 测量测量对象的三维形状的形状测量装置具有照射装备在台架上的测量对象的照明装置,拍摄测量对象的图像的成像装置,计算取向的形状计算装置 所述图像是通过在所述照明装置用所述光照射所述测量对象物的同时利用所述摄像装置进行成像而获得的图像,所述形状计算装置计算所述三维图像 根据法线方向的计算结果计算出测量目标表面的形状;测距装置,其测量与测量目标的表面上的至少一个点相对于预定基准位置的距离;以及确定装置 其决定了测量对象的表面的三维形状的空间位置 通过使用关于由测距装置获得的距离的信息的形状计算装置获得的ee尺寸形状。

    SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD
    2.
    发明申请
    SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD 有权
    形状测量装置和形状测量方法

    公开(公告)号:US20120086950A1

    公开(公告)日:2012-04-12

    申请号:US12901123

    申请日:2010-10-08

    IPC分类号: G01B11/24

    摘要: A shape measuring apparatus that measures a three-dimensional shape of a measuring target has a lighting device that irradiates the measuring target placed on a stage with light, an imaging device that takes an image of the measuring target, a shape calculating device that calculates orientations of normals at a plurality of points on a surface of the measuring target from an image, the image being obtained by performing imaging with the imaging device while the lighting device irradiates the measuring target with the light, the shape calculating device calculating the three-dimensional shape of the surface of the measuring target from the calculation result of the orientations of the normals, a ranging device that measures a distance from a predetermined reference position with respect to at least one point on the surface of the measuring target, and a determination device that determines a spatial position of the three-dimensional shape of the surface of the measuring target, the three-dimensional shape being obtained by the shape calculating device using information on the distance obtained by the ranging device.

    摘要翻译: 测量测量对象的三维形状的形状测量装置具有照射装备在台架上的测量对象的照明装置,拍摄测量对象的图像的成像装置,计算取向的形状计算装置 所述图像是通过在所述照明装置用所述光照射所述测量对象物的同时利用所述摄像装置进行成像而获得的图像,所述形状计算装置计算所述三维图像 根据法线方向的计算结果计算出测量目标表面的形状;测距装置,其测量距预定基准位置相对于测量目标表面上的至少一个点的距离;以及确定装置 其决定了测量对象的表面的三维形状的空间位置 通过使用关于由测距装置获得的距离的信息的形状计算装置获得的ee尺寸形状。

    APPARATUS AND METHOD FOR INSPECTING SURFACE STATE
    3.
    发明申请
    APPARATUS AND METHOD FOR INSPECTING SURFACE STATE 有权
    用于检查表面状态的装置和方法

    公开(公告)号:US20120087566A1

    公开(公告)日:2012-04-12

    申请号:US12901166

    申请日:2010-10-08

    IPC分类号: G06K9/00

    摘要: A surface state inspection apparatus has a lighting device that irradiates an inspection target placed on a stage with light, an imaging device that images the inspection target, and a detection device that detects a surface defect of the inspection target by analyzing a first inspection image obtained by the imaging device. The lighting device is a surface light source that includes a light emission region having a predetermined size and, in the lighting device, portions of light emitted from positions in the light emission region differ from each other in a spectral distribution. The detection device detects a portion in which a hue is different from that of its surrounding portion in the inspection target surface as a flaw. The detection device detects a portion in which the hue is substantially equal to that of its surrounding portion while brightness is different from that of its surrounding portion as a stain.

    摘要翻译: 表面状态检查装置具有照射装备有台灯的检查对象的照明装置,对检查对象进行成像的成像装置和检测对象的表面缺陷的检测装置,通过分析所获得的第一检查图像 通过成像装置。 照明装置是包括具有预定尺寸的发光区域的面光源,并且在照明装置中,从光发射区域中的位置发射的光的一部分在光谱分布中彼此不同。 检测装置作为缺陷,检测与检查对象面的周围部分的色相不同的部分。 检测装置检测其中色调与其周围部分的色调基本相等的部分,同时亮度与其周围部分的亮度不同,作为污点。

    Apparatus and method for inspecting surface state
    4.
    发明授权
    Apparatus and method for inspecting surface state 有权
    用于检查表面状态的装置和方法

    公开(公告)号:US08615125B2

    公开(公告)日:2013-12-24

    申请号:US12901166

    申请日:2010-10-08

    IPC分类号: G06K9/00

    摘要: A surface state inspection apparatus has a lighting device that irradiates an inspection target placed on a stage with light, an imaging device that images the inspection target, and a detection device that detects a surface defect of the inspection target by analyzing a first inspection image obtained by the imaging device. The lighting device is a surface light source that includes a light emission region having a predetermined size and, in the lighting device, portions of light emitted from positions in the light emission region differ from each other in a spectral distribution. The detection device detects a portion in which a hue is different from that of its surrounding portion in the inspection target surface as a flaw. The detection device detects a portion in which the hue is substantially equal to that of its surrounding portion while brightness is different from that of its surrounding portion as a stain.

    摘要翻译: 表面状态检查装置具有照射装备有台灯的检查对象的照明装置,对检查对象进行成像的成像装置和检测对象的表面缺陷的检测装置,通过分析所获得的第一检查图像 通过成像装置。 照明装置是包括具有预定尺寸的发光区域的面光源,并且在照明装置中,从光发射区域中的位置发射的光的一部分在光谱分布中彼此不同。 检测装置作为缺陷,检测与检查对象面的周围部分的色相不同的部分。 检测装置检测其中色调与其周围部分的色调基本相等的部分,同时亮度与其周围部分的亮度不同,作为污点。

    Shape measurement apparatus and calibration method
    5.
    发明授权
    Shape measurement apparatus and calibration method 有权
    形状测量装置和校准方法

    公开(公告)号:US08363929B2

    公开(公告)日:2013-01-29

    申请号:US13088704

    申请日:2011-04-18

    IPC分类号: G06K9/00 G06K9/46

    摘要: The shape measurement apparatus calculates a characteristic amount for a plurality of points of interest on a surface of a measurement target object, based on an image obtained by image capturing with a camera, calculates an orientation of a normal line based on a value of the characteristic amount by referencing data stored in advance in a storage device, and restores the three-dimensional shape of the surface of the measurement target object based on a result of the calculation. The storage device stores a plurality of data sets generated respectively for a plurality of reference positions arranged in a field of view of the camera, and the data set to be referenced is switched depending on a position of a point of interest.

    摘要翻译: 形状测量装置基于通过摄像机的图像拍摄获得的图像来计算测量对象物体的表面上的多个感兴趣点的特征量,基于特征值计算法线的取向 通过将预先存储在存储装置中的数据进行参考,并且基于计算结果来恢复测量目标对象的表面的三维形状。 存储装置存储分别针对在照相机的视野中排列的多个参考位置而生成的多个数据组,并且根据感兴趣点的位置切换要参考的数据集。