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1.
公开(公告)号:US20240047234A1
公开(公告)日:2024-02-08
申请号:US18227156
申请日:2023-07-27
Applicant: Tokyo Electron Limited
Inventor: Yosuke HACHIYA , Itaru KANNO , Mitsunori NAKAMORI , Hirofumi TAKEGUCHI
CPC classification number: H01L21/67023 , B08B3/14 , H01L21/02057
Abstract: A substrate processing apparatus includes: a holding unit, a processing cup, a first supply unit, a second supply unit, a drain unit, and a first measurement unit. The holding unit holds a substrate. The processing cup is provided around the holding unit. The first supply unit supplies a chemical liquid to the substrate held by the holding unit. The second supply unit supplies a rinse liquid or a drying liquid to the substrate held by the holding unit. The drain unit is provided at the bottom of the processing cup, and is connected to a drain line and a recovery line via a line switch. The first measurement unit is provided in the drain unit, and measures the purity of the rinse liquid or the drying liquid.
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公开(公告)号:US20240307821A1
公开(公告)日:2024-09-19
申请号:US18576898
申请日:2022-06-22
Applicant: Tokyo Electron Limited
Inventor: Yosuke HACHIYA , Mitsunori NAKAMORI , Koji KAGAWA
Abstract: A substrate processing system includes a batch processor, a single-substrate processor, and a transferrer. The batch processor collectively processes a plurality of substrates by immersing the plurality of substrates in ozonated water stored in a processing tank. The single-substrate processor processes the plurality of substrates one by one with a chemical liquid. The transferrer transfers the plurality of substrates in a wet state from the batch processor to the single-substrate processor.
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