SEMICONDUCTOR MEMORY DEVICE
    9.
    发明申请
    SEMICONDUCTOR MEMORY DEVICE 有权
    半导体存储器件

    公开(公告)号:US20110103136A1

    公开(公告)日:2011-05-05

    申请号:US12939069

    申请日:2010-11-03

    IPC分类号: G11C11/24 G11C7/06

    摘要: A sense amplifier is constructed to reduce the occurrence of malfunctions in a memory read operation, and thus degraded chip yield, due to increased offset of the sense amplifier with further sealing down. The sense amplifier circuit is constructed with a plurality of pull-down circuits and a pull-up circuit, and a transistor in one of the plurality of pull-down circuits has a constant such as a channel length or a channel width larger than that of a transistor in another pull-down circuit. The pull-down circuit with a larger constant of a transistor is first activated, and then, the other pull-down circuit and the pull-up circuit are activated to perform the read operation.

    摘要翻译: 构造读出放大器以减少存储器读取操作中的故障的发生,并因此由于读出放大器随着进一步的封闭而增加偏移而降低了芯片产量。 读出放大器电路由多个下拉电路和上拉电路构成,并且多个下拉电路之一中的晶体管具有常数,例如通道长度或通道宽度大于 另一个下拉电路中的晶体管。 首先激活具有较大的晶体管常数的下拉电路,然后激活另一个下拉电路和上拉电路以执行读取操作。

    Memory device having high speed sense amplifier comprising pull-up circuit and pull-down circuits with different drivability for each
    10.
    发明授权
    Memory device having high speed sense amplifier comprising pull-up circuit and pull-down circuits with different drivability for each 有权
    具有高速读出放大器的存储器件包括每个具有不同驱动能力的上拉电路和下拉电路

    公开(公告)号:US07224629B2

    公开(公告)日:2007-05-29

    申请号:US11071351

    申请日:2005-03-04

    IPC分类号: G11C7/02

    摘要: A sense amplifier is constructed to reduce the occurrence of malfunctions in a memory read operation, and thus degraded chip yield, due to increased offset of the sense amplifier with further sealing down. The sense amplifier circuit is constructed with a plurality of pull-down circuits and a pull-up circuit, and a transistor in one of the plurality of pull-down circuits has a constant such as a channel length or a channel width larger than that of a transistor in another pulldown circuit. The pull-down circuit with a larger constant of a transistor is first activated, and then, the other pull-down circuit and the pull-up circuit are activated to perform the read operation.

    摘要翻译: 构造读出放大器以减少存储器读取操作中的故障的发生,并因此由于读出放大器随着进一步的封闭而增加偏移而降低了芯片产量。 读出放大器电路由多个下拉电路和上拉电路构成,并且多个下拉电路之一中的晶体管具有常数,例如通道长度或通道宽度大于 另一个下拉电路中的晶体管。 首先激活具有较大的晶体管常数的下拉电路,然后激活另一个下拉电路和上拉电路以执行读取操作。