High-density memory cells and layouts thereof

    公开(公告)号:US12051457B2

    公开(公告)日:2024-07-30

    申请号:US17664465

    申请日:2022-05-23

    CPC classification number: G11C11/405

    Abstract: A device includes a write bit line and a read bit line extending in a first direction, and a write word line and a read word line extending in a second direction perpendicular to the first direction. The device further includes a memory cell including a write transistor and a read transistor. The write transistor includes a first gate connected to the write word line, a first source/drain connected to the write bit line, and a second source/drain connected to a data storage node. The read transistor includes a second gate connected to the data storage node, a third source/drain connected to the read bit line, and a fourth source/drain connected to the read word line.

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