Apparatus for measuring three dimensional shape, method for measuring three dimensional shape and three dimensional shape measurement program

    公开(公告)号:US10347029B2

    公开(公告)日:2019-07-09

    申请号:US15148180

    申请日:2016-05-06

    Abstract: A three-dimensional shape measurement apparatus includes an imaging unit that successively outputs two-dimensional images captured, a memory unit that stores the two-dimensional images outputted by the imaging unit, a three-dimensional shape model generation unit which generates a three-dimensional shape model, based on the two-dimensional images and stores the three-dimensional shape model in the memory unit, a region calculation unit that calculates, based on the two-dimensional images and the three-dimensional shape model stored in the memory unit, a measurement-completed region in the two-dimensional images, and a display image generation unit that generates, based on the measurement-completed region, a display image from the two-dimensional images.

Patent Agency Ranking